This work describes the growth of 3C-SiC on silicon by vapour phase epitaxy. The carburisation, a key step to nucleating SiC on silicon is treated in detail. The carburisation layer, characterised by X ray diffraction, and transmission electron microscopy, was found to be smooth, epitaxial and monocrystalline on the substrate. Chemical analysis by XPS shows that the layer is Si rich and that residues of the precursors remain on the surface.

Carburisation layers for the growth of silicon carbide on silicon

G Attolini;B Watts;M Bosi;C Frigeri;C Ferrari;G Salviati;T Besagni;S Kaciulis;
2007

Abstract

This work describes the growth of 3C-SiC on silicon by vapour phase epitaxy. The carburisation, a key step to nucleating SiC on silicon is treated in detail. The carburisation layer, characterised by X ray diffraction, and transmission electron microscopy, was found to be smooth, epitaxial and monocrystalline on the substrate. Chemical analysis by XPS shows that the layer is Si rich and that residues of the precursors remain on the surface.
2007
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Istituto per lo Studio dei Materiali Nanostrutturati - ISMN
Inglese
Lorenzo Faraone, Sabine Betts, John Dell, Charlie Mu sca, Brett Nener, Gia Parish, Justin Wehner
Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD
2006 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2006
32
34
978-1-4244-0578-7
IEEE, 345 E 47TH ST, NY 10017
NEW YORK
STATI UNITI D'AMERICA
Sì, ma tipo non specificato
6-8 December 2006
Perth, Australia
Component silicon carbide
Nucleation
Vapour phase epitaxy
XPS
9
none
Attolini, G; Watts, B; Bosi, M; Frigeri, C; Ferrari, C; Salviati, G; Besagni, T; Kaciulis, S; Pandolfi, L
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/178138
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