Single layers of graphene (SLG) mechanically exfoliated from highly oriented pyrolytic graphite and deposited on SiCVSi were irradiated with C + ions at different fluences (from 10 13 to 10 14cm -2), in order to modify the transport properties in controlled way. Using a method based on scanning probe microscopy, local measurements of the electron mean free path (I) have been carried out both on pristine and ion irradiated SLG. A lateral inhomogeneity of l was found in both cases, with an increasing spread in the distribution of l for larger fluences. Before irradiation, the spread was explained by the inhomogeneous distribution of charged impurities on SLG surface and/or at the interface with SiO 2. After irradiation, lattice vacancies cause a local reduction of l in the damaged regions.

Nanoscale modification of graphene transport properties by ion irradiation

Giannazzo F;Raineri V;Rimini E
2010

Abstract

Single layers of graphene (SLG) mechanically exfoliated from highly oriented pyrolytic graphite and deposited on SiCVSi were irradiated with C + ions at different fluences (from 10 13 to 10 14cm -2), in order to modify the transport properties in controlled way. Using a method based on scanning probe microscopy, local measurements of the electron mean free path (I) have been carried out both on pristine and ion irradiated SLG. A lateral inhomogeneity of l was found in both cases, with an increasing spread in the distribution of l for larger fluences. Before irradiation, the spread was explained by the inhomogeneous distribution of charged impurities on SLG surface and/or at the interface with SiO 2. After irradiation, lattice vacancies cause a local reduction of l in the damaged regions.
2010
Istituto per la Microelettronica e Microsistemi - IMM
Charged impurity
Damaged region
Electron mean free path
Fluences
Highly oriented pyrolytic graphite
Inhomogeneous distribution
Ion irradiation
Lateral inhomogeneity
Lattice vacancy
Local measurement
Nanoscale modifications
Single layer
Graphene
Ions
Irradiation
Scanning probe microscopy
Silicon compounds
Transport properties
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/247823
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