The development of silicon-based nanoscale technology for the realization of single electron, single spin quantum devices demands deep donor-based systems to achieve a major breakthrough in the field: high-temperature operation. Here, we suggest that, despite some preparation difficulties, substitutional nitrogen in silicon (N_{Si}) represents an interesting candidate for this purpose, being observable by electron paramagnetic resonance (EPR) at room temperature. We report a study of the nature and dynamics of substitutional nitrogen in silicon, the so-called SL5 paramagnetic center, by X-band continuous-wave EPR, complemented by pulsed EPR. Both natural and ^{28}Si isotopically enriched nitrogen-doped silicon samples have been used, the latter providing an improvement in the accuracy of the spin Hamiltonian parameters.

Electron spin resonance of substitutional nitrogen in silicon

M Belli;M Fanciulli;
2014

Abstract

The development of silicon-based nanoscale technology for the realization of single electron, single spin quantum devices demands deep donor-based systems to achieve a major breakthrough in the field: high-temperature operation. Here, we suggest that, despite some preparation difficulties, substitutional nitrogen in silicon (N_{Si}) represents an interesting candidate for this purpose, being observable by electron paramagnetic resonance (EPR) at room temperature. We report a study of the nature and dynamics of substitutional nitrogen in silicon, the so-called SL5 paramagnetic center, by X-band continuous-wave EPR, complemented by pulsed EPR. Both natural and ^{28}Si isotopically enriched nitrogen-doped silicon samples have been used, the latter providing an improvement in the accuracy of the spin Hamiltonian parameters.
2014
Istituto per la Microelettronica e Microsistemi - IMM
electron paramagnetic resonance
donors in silicon
nitrogen
reorientation dynamics
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/250413
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