In this work, we present the first experimental evidence of negative dielectric susceptibility in a two-dimensional silicon photonic crystal (PhC) with negative refractive index behavior. In the frequency range in which the effective refractive index n(eff) is equal to -1, the incident light couples efficiently to the guided modes in the top surface layer of the PhC metamaterial. These modes resemble surface plasmon polariton resonances. This finding was confirmed by ellipsometric measurements, demonstrating the isotropy of the PhC resonances. Such negative index PhC materials may be of use in biosensing applications.

Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial

Dardano Principia;Rendina Ivo;Mocella Vito
2012

Abstract

In this work, we present the first experimental evidence of negative dielectric susceptibility in a two-dimensional silicon photonic crystal (PhC) with negative refractive index behavior. In the frequency range in which the effective refractive index n(eff) is equal to -1, the incident light couples efficiently to the guided modes in the top surface layer of the PhC metamaterial. These modes resemble surface plasmon polariton resonances. This finding was confirmed by ellipsometric measurements, demonstrating the isotropy of the PhC resonances. Such negative index PhC materials may be of use in biosensing applications.
2012
Istituto per la Microelettronica e Microsistemi - IMM
diffraction gratings
metamaterials
photonic crystals
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/255705
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