The recent demand of heat handling on materials compatible with the harsh environments of fusion reactors has led to increased efforts into materials research. The high heat load afforded by liquid metals together with their regenerative properties and resilience to neutron damage make them eminently suitable for use as Plasma Facing Components (PFCs). Among liquid metals tin (Sn) is a valid candidate because it presents low vapour pressure and low reactivity with hydrogen, however, it is also characterised by a high atomic number, Z = 50, which causes concerns about plasma contamination. Optical Emission Spectroscopy (OES) is an optical plasma diagnostics that can be used to estimate impurity influx through the S/XB spectroscopic parameter, [1]. The aim of this work is the spectroscopic determination of the S/XB factor for Sn I line at 380.1 nm in the plasma Gyrotron Machine (GyM) through the empiric evaluation of the mass loss. Two different magnetic configurations have been exploited to permit the exposure of both solid and liquid Sn samples. In particular, a linear magnetic configuration was used to expose solid samples and a double-cusp configuration for liquid samples without making use of a capillary porous system.

Experimental determination of S/XB values of Sn I emission lines in GyM device

A Cremona;A Uccello;F Causa;R Caniello;S De Iuliis;R Donde;G Gervasini;F Ghezzi;G Granucci;L Laguardia;V Mellera;A Nardone;M Pedroni;D Ricci;N Rispoli;E Vassallo
2017

Abstract

The recent demand of heat handling on materials compatible with the harsh environments of fusion reactors has led to increased efforts into materials research. The high heat load afforded by liquid metals together with their regenerative properties and resilience to neutron damage make them eminently suitable for use as Plasma Facing Components (PFCs). Among liquid metals tin (Sn) is a valid candidate because it presents low vapour pressure and low reactivity with hydrogen, however, it is also characterised by a high atomic number, Z = 50, which causes concerns about plasma contamination. Optical Emission Spectroscopy (OES) is an optical plasma diagnostics that can be used to estimate impurity influx through the S/XB spectroscopic parameter, [1]. The aim of this work is the spectroscopic determination of the S/XB factor for Sn I line at 380.1 nm in the plasma Gyrotron Machine (GyM) through the empiric evaluation of the mass loss. Two different magnetic configurations have been exploited to permit the exposure of both solid and liquid Sn samples. In particular, a linear magnetic configuration was used to expose solid samples and a double-cusp configuration for liquid samples without making use of a capillary porous system.
2017
Istituto di Chimica della Materia Condensata e di Tecnologie per l'Energia - ICMATE
Istituto di fisica del plasma - IFP - Sede Milano
979-10-96389-05-6
emission spectroscopy
plasma Physics
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/327625
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