CANIELLO, ROBERTO
CANIELLO, ROBERTO
Unraveling the mechanism of maskless nanopatterning of black-silicon by CF4/H2 plasma reactive ion etching
2022 Ghezzi, FRANCESCO MAURO; Pedroni, Matteo; Kovac, Janez; Causa, Federica; Cremona, Anna; Anderle, Mariano; Caniello, Roberto; Pietralunga Silvia, M; Vassallo, Espedito
Evidence of formation of lithium compounds on FTU tiles and dust
2018 Ghezzi, F.; Laguardia, L.; Apicella, M. L.; Bressan, C.; Caniello, R.; Cippo, E. Perelli; Conti, C.; De Angeli, M.; Maddaluno, G.; Mazzitelli, G.
Experimental determination of S/XB values of Sn I emission lines in GyM device
2017 Cremona, A; Uccello, A; Causa, F; Caniello, R; DE IULIIS, Silvana; Donde, R; Gervasini, G; Ghezzi, F; Granucci, G; Laguardia, L; Mellera, V; Minelli, D; Nardone, A; Pedroni, M; Ricci, D; Rispoli, N; Vassallo, E
Influence of He and Ar injection on ammonia production in N-2/D-2 plasma in the medium flux GyM device
2017 Laguardia, L; Caniello, R; Cremona, A; Gatto, G; Gervasini, G; Ghezzi, F; Granucci, G; Mellera, V; Minelli, D; Negrotti, R; Pedroni, M; Realini, M; Ricci, D; Rispoli, N; Uccello, A; Vassallo, E
Nanocrystalline diamond produced by direct current micro-plasma: Investigation of growth dynamics
2017 Inzoli, F; Dellasega, D; Russo, V; Caniello, R; Conti, C; Ghezzi, F; Passoni, M
Plasma-wall interaction studies in the full-W ASDEX upgrade during helium plasma discharges
2017 Hakola, A; Brezinsek, S; Douai, D; Balden, M; Bobkov, V; Carralero, D; Greuner, H; Elgeti, S; Kallenbach, A; Krieger, K; Meisl, G; Oberkofler, M; Rohde, V; Schneider, P; Schwarzselinger, T; Lahtinen, A; De Temmerman, G; Caniello, R; Ghezzi, F; Wauters, T; Garciacarrasco, A; Petersson, P; Radovic, I Bogdanovic; Siketic, Z
Plasma-wall interaction studies within the EUROfusion consortium: Progress on plasma-facing components development and qualification
2017 Brezinsek S.; Coenen J.W.; SchwarzSelinger T.; Schmid K.; Kirschner A.; Hakola A.; Tabares F.L.; Van Der Meiden H.J.; Mayoral M.L.; Reinhart M.; Tsitrone E.; Ahlgren T.; Aints M.; Airila M.; Almaviva S.; Alves E.; Angot T.; Anita V.; Arredondo Parra R.; Aumayr F.; Balden M.; Bauer J.; Ben Yaala M.; Berger B.M.; Bisson R.; Bjorkas C.; Bogdanovic Radovic I.; Borodin D.; Bucalossi J.; Butikova J.; Butoi B.; Cadez I.; Caniello R.; Caneve L.; Cartry G.; Catarino N.; Cekada M.; Ciraolo G.; Ciupinski L.; Colao F.; Corre Y.; Costin C.; Craciunescu T.; Cremona A.; De Angeli M.; De Castro A.; Dejarnac R.; Dellasega D.; Dinca P.; Dittmar T.; Dobrea C.; Hansen P.; Drenik A.; Eich T.; Elgeti S.; Falie D.; Fedorczak N.; Ferro Y.; Fornal T.; FortunaZalesna E.; Gao L.; Gasior P.; Gherendi M.; Ghezzi F.; Gosar Z.; Greuner H.; Grigore E.; Grisolia C.; Groth M.; Gruca M.; Grzonka J.; Gunn J.P.; Hassouni K.; Heinola K.; Hoschen T.; Huber S.; Jacob W.; Jepu I.; Jiang X.; Jogi I.; Kaiser A.; Karhunen J.; Kelemen M.; Koppen M.; Koslowski H.R.; Kreter A.; Kubkowska M.; Laan M.; Laguardia L.; Lahtinen A.; Lasa A.; Lazic V.; Lemahieu N.; Likonen J.; Linke J.; Litnovsky A.; Linsmeier C.; Loewenhoff T.; Lungu C.; Lungu M.; Maddaluno G.; Maier H.; Makkonen T.; Manhard A.; Marandet Y.; Markelj S.; Marot L.; Martin C.; MartinRojo A.B.; Martynova Y.; Mateus R.; Matveev D.; Mayer M.; Meisl G.; Mellet N.; Michau A.; Miettunen J.; Moller S.; Morgan T.W.; Mougenot J.; Mozetic M.; Nemanic V.; Neu R.; Nordlund K.; Oberkofler M.; Oyarzabal E.; Panjan M.; Pardanaud C.; Paris P.; Passoni M.; Pegourie B.; Pelicon P.; Petersson P.; Piip K.; Pintsuk G.; Pompilian G.O.; Popa G.; Porosnicu C.; Primc G.; Probst M.; Raisanen J.; Rasinski M.; Ratynskaia S.; Reiser D.; Ricci D.; Richou M.; Riesch J.; Riva G.; Rosinski M.; Roubin P.; Rubel M.; Ruset C.; Safi E.; Sergienko G.; Siketic Z.; Sima A.; Spilker B.; Stadlmayr R.; Steudel I.; Strom P.; Tadic T.; Tafalla D.; Tale I.; Terentyev D.; Terra A.; Tiron V.; Tiseanu I.; Tolias P.; Tskhakaya D.; Uccello A.; Unterberg B.; Uytdenhoven I.; Vassallo E.; Vavpetic P.; Veis P.; Velicu I.L.; Vernimmen J.W.M.; Voitkans A.; Von Toussaint U.; Weckmann A.; Wirtz M.; Zaloznik A.; Zaplotnik R.
Black-silicon production process by CF4/H2 plasma
2016 Vassallo E.; Pedroni M.; Pietralunga S.M.; Caniello R.; Cremona A.; Di Fonzo F.; Ghezzi F.; Inzoli F.; Monteleone G.; Nava, G.; Spampinato V.; Tagliaferri A.; Zani M.; Angella G.
Effect of temperature on D retention in WNx layers exposed to low-energy, high-fluence D plasmas
2016 Vassallo E.; Angella G.; Caniello R.; Gittini G.; Granucci G.; Mellera V.; Minelli M.; Pallotta F.; Pedroni M.; Ricci D.; Rigato V.
Neutron radiography as a non-destructive method for diagnosing neutron converters for advanced thermal neutron detectors
2016 Muraro, A; Albani, G; Cippo, Ep; Croci, G; Angella, G; Birch, J; Cazzaniga, C; Caniello, R; Dell'Era, F; Ghezzi, F; Grosso, G; Hallwilton, R; Hoglund, C; Hultman, L; Schimdt, S; Robinson, L; Rebai, M; Salvato, G; Tresoldi, D; Vasi, C; Tardocchi, M
Post-mortem analyses of limiter tiles of FTU
2016 Marco De Angeli ; Francesco Ghezzi ; Laura Laguardia ; GiorgioMaddaluno ; Dario Ripamonti ; Giulio Riva ; Roberto Caniello ;Giambattista Daminelli ; Monica De Angeli ; Fabio Dell'Era ; DanielaDimartino ; Stefano Lecci ; Federico Ripamonti
A method of surface texturization of silicon by a maskless plasma process
2015 Vassallo, E; Caniello, R; Cremona, A; Ghezzi, F; Inzoli, F; Laguardia, L; Pallotta, F; Pedroni, M; Spampinato, V
Ammonia formation and W coatings interaction with deuterium/nitrogen plasmas in the linear device GyM
2015 L. Laguardia ; R. Caniello ; A. Cremona ; D. Dellasega a,b; F. Dell'Era ; F. Ghezzi ; G. Gittini ;G. Granucci ; V. Mellera ; D. Minelli ; F. Pallotta ; M. Passoni a,b; D. Ricci ; E. Vassallo
Characterization of Titanium Dioxide thin films produced by RF plasma sputtering technique for photocatalytic applications
2015 Inzoli, F; Angella, G; Caniello, R; Canetti, M; Pedroni, M; Vassallo, E
Characterization of Titanium Dioxide thin films produced by RF plasma sputtering technique for photocatalytic applications
2015 Inzoli, F; Angella, G; Caniello, R; Canetti, M; Pedroni, M; Vassallo, E
Effects of Nitrogen Concentration on Microstructure of Tungsten Coatings Synthesized by Plasma Sputtering Method
2015 Vassallo E.; Angella G.; Caniello R.; Deambrosis S.; Inzoli F.; Miorin E.; Pedroni M.
Formation of nanostructures in silicon by a maskless plasma process
2015 M. Pedroni; E. Vassallo; F. Inzoli; R. Caniello; A. Cremona; F. Ghezzi; L. Laguardia; V. Spampinato
Investigation on FTU dust and on the origin of ferromagnetic and lithiated grains
2015 De Angeli M.; Laguardia L.; Maddaluno G.; Perelli Cippo E.; Ripamonti D.; Apicella M.L.; Bressan C.; Caniello R.; Conti C.; Ghezzi F.; Grosso G.; Mazzitelli G.
Retention of nanocrystalline WNx layers exposed to high-fluence deuterium plasmas
2015 Vassallo E.; Caniello R.; Angella G.; Dellasega D.; Granucci G.; Mellera V.; Minelli D.; Pedroni M.; Ricci D.; Rigato V.; Passoni M.
Surface diagnostics of nanostructured silicon by CF4/H2 plasmas
2015 Caniello, R; Vassallo, E; Cremona, A; Ghezzi, F; Laguardia, L; Pedroni, M; Spampinato, V; Anderle, M
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Unraveling the mechanism of maskless nanopatterning of black-silicon by CF4/H2 plasma reactive ion etching | 1-gen-2022 | Ghezzi, FRANCESCO MAURO; Pedroni, Matteo; Kovac, Janez; Causa, Federica; Cremona, Anna; Anderle, Mariano; Caniello, Roberto; Pietralunga Silvia, M; Vassallo, Espedito | |
| Evidence of formation of lithium compounds on FTU tiles and dust | 1-gen-2018 | Ghezzi, F.; Laguardia, L.; Apicella, M. L.; Bressan, C.; Caniello, R.; Cippo, E. Perelli; Conti, C.; De Angeli, M.; Maddaluno, G.; Mazzitelli, G. | |
| Experimental determination of S/XB values of Sn I emission lines in GyM device | 1-gen-2017 | Cremona, A; Uccello, A; Causa, F; Caniello, R; DE IULIIS, Silvana; Donde, R; Gervasini, G; Ghezzi, F; Granucci, G; Laguardia, L; Mellera, V; Minelli, D; Nardone, A; Pedroni, M; Ricci, D; Rispoli, N; Vassallo, E | |
| Influence of He and Ar injection on ammonia production in N-2/D-2 plasma in the medium flux GyM device | 1-gen-2017 | Laguardia, L; Caniello, R; Cremona, A; Gatto, G; Gervasini, G; Ghezzi, F; Granucci, G; Mellera, V; Minelli, D; Negrotti, R; Pedroni, M; Realini, M; Ricci, D; Rispoli, N; Uccello, A; Vassallo, E | |
| Nanocrystalline diamond produced by direct current micro-plasma: Investigation of growth dynamics | 1-gen-2017 | Inzoli, F; Dellasega, D; Russo, V; Caniello, R; Conti, C; Ghezzi, F; Passoni, M | |
| Plasma-wall interaction studies in the full-W ASDEX upgrade during helium plasma discharges | 1-gen-2017 | Hakola, A; Brezinsek, S; Douai, D; Balden, M; Bobkov, V; Carralero, D; Greuner, H; Elgeti, S; Kallenbach, A; Krieger, K; Meisl, G; Oberkofler, M; Rohde, V; Schneider, P; Schwarzselinger, T; Lahtinen, A; De Temmerman, G; Caniello, R; Ghezzi, F; Wauters, T; Garciacarrasco, A; Petersson, P; Radovic, I Bogdanovic; Siketic, Z | |
| Plasma-wall interaction studies within the EUROfusion consortium: Progress on plasma-facing components development and qualification | 1-gen-2017 | Brezinsek S.; Coenen J.W.; SchwarzSelinger T.; Schmid K.; Kirschner A.; Hakola A.; Tabares F.L.; Van Der Meiden H.J.; Mayoral M.L.; Reinhart M.; Tsitrone E.; Ahlgren T.; Aints M.; Airila M.; Almaviva S.; Alves E.; Angot T.; Anita V.; Arredondo Parra R.; Aumayr F.; Balden M.; Bauer J.; Ben Yaala M.; Berger B.M.; Bisson R.; Bjorkas C.; Bogdanovic Radovic I.; Borodin D.; Bucalossi J.; Butikova J.; Butoi B.; Cadez I.; Caniello R.; Caneve L.; Cartry G.; Catarino N.; Cekada M.; Ciraolo G.; Ciupinski L.; Colao F.; Corre Y.; Costin C.; Craciunescu T.; Cremona A.; De Angeli M.; De Castro A.; Dejarnac R.; Dellasega D.; Dinca P.; Dittmar T.; Dobrea C.; Hansen P.; Drenik A.; Eich T.; Elgeti S.; Falie D.; Fedorczak N.; Ferro Y.; Fornal T.; FortunaZalesna E.; Gao L.; Gasior P.; Gherendi M.; Ghezzi F.; Gosar Z.; Greuner H.; Grigore E.; Grisolia C.; Groth M.; Gruca M.; Grzonka J.; Gunn J.P.; Hassouni K.; Heinola K.; Hoschen T.; Huber S.; Jacob W.; Jepu I.; Jiang X.; Jogi I.; Kaiser A.; Karhunen J.; Kelemen M.; Koppen M.; Koslowski H.R.; Kreter A.; Kubkowska M.; Laan M.; Laguardia L.; Lahtinen A.; Lasa A.; Lazic V.; Lemahieu N.; Likonen J.; Linke J.; Litnovsky A.; Linsmeier C.; Loewenhoff T.; Lungu C.; Lungu M.; Maddaluno G.; Maier H.; Makkonen T.; Manhard A.; Marandet Y.; Markelj S.; Marot L.; Martin C.; MartinRojo A.B.; Martynova Y.; Mateus R.; Matveev D.; Mayer M.; Meisl G.; Mellet N.; Michau A.; Miettunen J.; Moller S.; Morgan T.W.; Mougenot J.; Mozetic M.; Nemanic V.; Neu R.; Nordlund K.; Oberkofler M.; Oyarzabal E.; Panjan M.; Pardanaud C.; Paris P.; Passoni M.; Pegourie B.; Pelicon P.; Petersson P.; Piip K.; Pintsuk G.; Pompilian G.O.; Popa G.; Porosnicu C.; Primc G.; Probst M.; Raisanen J.; Rasinski M.; Ratynskaia S.; Reiser D.; Ricci D.; Richou M.; Riesch J.; Riva G.; Rosinski M.; Roubin P.; Rubel M.; Ruset C.; Safi E.; Sergienko G.; Siketic Z.; Sima A.; Spilker B.; Stadlmayr R.; Steudel I.; Strom P.; Tadic T.; Tafalla D.; Tale I.; Terentyev D.; Terra A.; Tiron V.; Tiseanu I.; Tolias P.; Tskhakaya D.; Uccello A.; Unterberg B.; Uytdenhoven I.; Vassallo E.; Vavpetic P.; Veis P.; Velicu I.L.; Vernimmen J.W.M.; Voitkans A.; Von Toussaint U.; Weckmann A.; Wirtz M.; Zaloznik A.; Zaplotnik R. | |
| Black-silicon production process by CF4/H2 plasma | 1-gen-2016 | Vassallo E.; Pedroni M.; Pietralunga S.M.; Caniello R.; Cremona A.; Di Fonzo F.; Ghezzi F.; Inzoli F.; Monteleone G.; Nava, G.; Spampinato V.; Tagliaferri A.; Zani M.; Angella G. | |
| Effect of temperature on D retention in WNx layers exposed to low-energy, high-fluence D plasmas | 1-gen-2016 | Vassallo E.; Angella G.; Caniello R.; Gittini G.; Granucci G.; Mellera V.; Minelli M.; Pallotta F.; Pedroni M.; Ricci D.; Rigato V. | |
| Neutron radiography as a non-destructive method for diagnosing neutron converters for advanced thermal neutron detectors | 1-gen-2016 | Muraro, A; Albani, G; Cippo, Ep; Croci, G; Angella, G; Birch, J; Cazzaniga, C; Caniello, R; Dell'Era, F; Ghezzi, F; Grosso, G; Hallwilton, R; Hoglund, C; Hultman, L; Schimdt, S; Robinson, L; Rebai, M; Salvato, G; Tresoldi, D; Vasi, C; Tardocchi, M | |
| Post-mortem analyses of limiter tiles of FTU | 1-gen-2016 | Marco De Angeli ; Francesco Ghezzi ; Laura Laguardia ; GiorgioMaddaluno ; Dario Ripamonti ; Giulio Riva ; Roberto Caniello ;Giambattista Daminelli ; Monica De Angeli ; Fabio Dell'Era ; DanielaDimartino ; Stefano Lecci ; Federico Ripamonti | |
| A method of surface texturization of silicon by a maskless plasma process | 1-gen-2015 | Vassallo, E; Caniello, R; Cremona, A; Ghezzi, F; Inzoli, F; Laguardia, L; Pallotta, F; Pedroni, M; Spampinato, V | |
| Ammonia formation and W coatings interaction with deuterium/nitrogen plasmas in the linear device GyM | 1-gen-2015 | L. Laguardia ; R. Caniello ; A. Cremona ; D. Dellasega a,b; F. Dell'Era ; F. Ghezzi ; G. Gittini ;G. Granucci ; V. Mellera ; D. Minelli ; F. Pallotta ; M. Passoni a,b; D. Ricci ; E. Vassallo | |
| Characterization of Titanium Dioxide thin films produced by RF plasma sputtering technique for photocatalytic applications | 1-gen-2015 | Inzoli, F; Angella, G; Caniello, R; Canetti, M; Pedroni, M; Vassallo, E | |
| Characterization of Titanium Dioxide thin films produced by RF plasma sputtering technique for photocatalytic applications | 1-gen-2015 | Inzoli, F; Angella, G; Caniello, R; Canetti, M; Pedroni, M; Vassallo, E | |
| Effects of Nitrogen Concentration on Microstructure of Tungsten Coatings Synthesized by Plasma Sputtering Method | 1-gen-2015 | Vassallo E.; Angella G.; Caniello R.; Deambrosis S.; Inzoli F.; Miorin E.; Pedroni M. | |
| Formation of nanostructures in silicon by a maskless plasma process | 1-gen-2015 | M. Pedroni; E. Vassallo; F. Inzoli; R. Caniello; A. Cremona; F. Ghezzi; L. Laguardia; V. Spampinato | |
| Investigation on FTU dust and on the origin of ferromagnetic and lithiated grains | 1-gen-2015 | De Angeli M.; Laguardia L.; Maddaluno G.; Perelli Cippo E.; Ripamonti D.; Apicella M.L.; Bressan C.; Caniello R.; Conti C.; Ghezzi F.; Grosso G.; Mazzitelli G. | |
| Retention of nanocrystalline WNx layers exposed to high-fluence deuterium plasmas | 1-gen-2015 | Vassallo E.; Caniello R.; Angella G.; Dellasega D.; Granucci G.; Mellera V.; Minelli D.; Pedroni M.; Ricci D.; Rigato V.; Passoni M. | |
| Surface diagnostics of nanostructured silicon by CF4/H2 plasmas | 1-gen-2015 | Caniello, R; Vassallo, E; Cremona, A; Ghezzi, F; Laguardia, L; Pedroni, M; Spampinato, V; Anderle, M |