CANIELLO, ROBERTO

CANIELLO, ROBERTO  

Istituto di fisica del plasma - IFP - Sede Milano (attivo dal 18/11/1923 al 31/12/2021)  

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Risultati 1 - 20 di 46 (tempo di esecuzione: 0.048 secondi).
Titolo Data di pubblicazione Autore(i) File
Unraveling the mechanism of maskless nanopatterning of black-silicon by CF4/H2 plasma reactive ion etching 1-gen-2022 Ghezzi, FRANCESCO MAURO; Pedroni, Matteo; Kovac, Janez; Causa, Federica; Cremona, Anna; Anderle, Mariano; Caniello, Roberto; Pietralunga Silvia, M; Vassallo, Espedito
Evidence of formation of lithium compounds on FTU tiles and dust 1-gen-2018 Ghezzi, F.; Laguardia, L.; Apicella, M. L.; Bressan, C.; Caniello, R.; Cippo, E. Perelli; Conti, C.; De Angeli, M.; Maddaluno, G.; Mazzitelli, G.
Experimental determination of S/XB values of Sn I emission lines in GyM device 1-gen-2017 Cremona, A; Uccello, A; Causa, F; Caniello, R; DE IULIIS, Silvana; Donde, R; Gervasini, G; Ghezzi, F; Granucci, G; Laguardia, L; Mellera, V; Minelli, D; Nardone, A; Pedroni, M; Ricci, D; Rispoli, N; Vassallo, E
Influence of He and Ar injection on ammonia production in N-2/D-2 plasma in the medium flux GyM device 1-gen-2017 Laguardia, L; Caniello, R; Cremona, A; Gatto, G; Gervasini, G; Ghezzi, F; Granucci, G; Mellera, V; Minelli, D; Negrotti, R; Pedroni, M; Realini, M; Ricci, D; Rispoli, N; Uccello, A; Vassallo, E
Nanocrystalline diamond produced by direct current micro-plasma: Investigation of growth dynamics 1-gen-2017 Inzoli, F; Dellasega, D; Russo, V; Caniello, R; Conti, C; Ghezzi, F; Passoni, M
Plasma-wall interaction studies in the full-W ASDEX upgrade during helium plasma discharges 1-gen-2017 Hakola, A; Brezinsek, S; Douai, D; Balden, M; Bobkov, V; Carralero, D; Greuner, H; Elgeti, S; Kallenbach, A; Krieger, K; Meisl, G; Oberkofler, M; Rohde, V; Schneider, P; Schwarzselinger, T; Lahtinen, A; De Temmerman, G; Caniello, R; Ghezzi, F; Wauters, T; Garciacarrasco, A; Petersson, P; Radovic, I Bogdanovic; Siketic, Z
Plasma-wall interaction studies within the EUROfusion consortium: Progress on plasma-facing components development and qualification 1-gen-2017 Brezinsek S.; Coenen J.W.; SchwarzSelinger T.; Schmid K.; Kirschner A.; Hakola A.; Tabares F.L.; Van Der Meiden H.J.; Mayoral M.L.; Reinhart M.; Tsitrone E.; Ahlgren T.; Aints M.; Airila M.; Almaviva S.; Alves E.; Angot T.; Anita V.; Arredondo Parra R.; Aumayr F.; Balden M.; Bauer J.; Ben Yaala M.; Berger B.M.; Bisson R.; Bjorkas C.; Bogdanovic Radovic I.; Borodin D.; Bucalossi J.; Butikova J.; Butoi B.; Cadez I.; Caniello R.; Caneve L.; Cartry G.; Catarino N.; Cekada M.; Ciraolo G.; Ciupinski L.; Colao F.; Corre Y.; Costin C.; Craciunescu T.; Cremona A.; De Angeli M.; De Castro A.; Dejarnac R.; Dellasega D.; Dinca P.; Dittmar T.; Dobrea C.; Hansen P.; Drenik A.; Eich T.; Elgeti S.; Falie D.; Fedorczak N.; Ferro Y.; Fornal T.; FortunaZalesna E.; Gao L.; Gasior P.; Gherendi M.; Ghezzi F.; Gosar Z.; Greuner H.; Grigore E.; Grisolia C.; Groth M.; Gruca M.; Grzonka J.; Gunn J.P.; Hassouni K.; Heinola K.; Hoschen T.; Huber S.; Jacob W.; Jepu I.; Jiang X.; Jogi I.; Kaiser A.; Karhunen J.; Kelemen M.; Koppen M.; Koslowski H.R.; Kreter A.; Kubkowska M.; Laan M.; Laguardia L.; Lahtinen A.; Lasa A.; Lazic V.; Lemahieu N.; Likonen J.; Linke J.; Litnovsky A.; Linsmeier C.; Loewenhoff T.; Lungu C.; Lungu M.; Maddaluno G.; Maier H.; Makkonen T.; Manhard A.; Marandet Y.; Markelj S.; Marot L.; Martin C.; MartinRojo A.B.; Martynova Y.; Mateus R.; Matveev D.; Mayer M.; Meisl G.; Mellet N.; Michau A.; Miettunen J.; Moller S.; Morgan T.W.; Mougenot J.; Mozetic M.; Nemanic V.; Neu R.; Nordlund K.; Oberkofler M.; Oyarzabal E.; Panjan M.; Pardanaud C.; Paris P.; Passoni M.; Pegourie B.; Pelicon P.; Petersson P.; Piip K.; Pintsuk G.; Pompilian G.O.; Popa G.; Porosnicu C.; Primc G.; Probst M.; Raisanen J.; Rasinski M.; Ratynskaia S.; Reiser D.; Ricci D.; Richou M.; Riesch J.; Riva G.; Rosinski M.; Roubin P.; Rubel M.; Ruset C.; Safi E.; Sergienko G.; Siketic Z.; Sima A.; Spilker B.; Stadlmayr R.; Steudel I.; Strom P.; Tadic T.; Tafalla D.; Tale I.; Terentyev D.; Terra A.; Tiron V.; Tiseanu I.; Tolias P.; Tskhakaya D.; Uccello A.; Unterberg B.; Uytdenhoven I.; Vassallo E.; Vavpetic P.; Veis P.; Velicu I.L.; Vernimmen J.W.M.; Voitkans A.; Von Toussaint U.; Weckmann A.; Wirtz M.; Zaloznik A.; Zaplotnik R.
Black-silicon production process by CF4/H2 plasma 1-gen-2016 Vassallo, E; Pedroni, M; Pietralunga, Sm; Caniello, R; Cremona, A; Di Fonzo, F; Ghezzi, F; Inzoli, F; Monteleone, G; Nava, G; Spampinato, V; Tagliaferri, A; Zani, M; Angella, G
Effect of temperature on D retention in WNx layers exposed to low-energy, high-fluence D plasmas 1-gen-2016 Vassallo, E; Angella, G; Caniello, R; Gittini, G; Granucci, G; Mellera, V; Minelli, M; Pallotta, F; Pedroni, M; Ricci, D; Rigato, V
Neutron radiography as a non-destructive method for diagnosing neutron converters for advanced thermal neutron detectors 1-gen-2016 Muraro, A; Albani, G; Cippo, Ep; Croci, G; Angella, G; Birch, J; Cazzaniga, C; Caniello, R; Dell'Era, F; Ghezzi, F; Grosso, G; Hallwilton, R; Hoglund, C; Hultman, L; Schimdt, S; Robinson, L; Rebai, M; Salvato, G; Tresoldi, D; Vasi, C; Tardocchi, M
Post-mortem analyses of limiter tiles of FTU 1-gen-2016 DE ANGELI, Marco; Ghezzi, Francesco; Laguardia, Laura; Giorgiomaddaluno, ; Ripamonti, Dario; Riva, Giulio; Caniello, Roberto; Daminelli, Giambattista; DE ANGELI, Monica; Dell'Era, Fabio; Danieladimartino, ; Lecci, Stefano; Ripamonti, Federico
A method of surface texturization of silicon by a maskless plasma process 1-gen-2015 Vassallo, E; Caniello, R; Cremona, A; Ghezzi, F; Inzoli, F; Laguardia, L; Pallotta, F; Pedroni, M; Spampinato, V
Ammonia formation and W coatings interaction with deuterium/nitrogen plasmas in the linear device GyM 1-gen-2015 L. Laguardia ; R. Caniello ; A. Cremona ; D. Dellasega a,b; F. Dell'Era ; F. Ghezzi ; G. Gittini ;G. Granucci ; V. Mellera ; D. Minelli ; F. Pallotta ; M. Passoni a,b; D. Ricci ; E. Vassallo
Characterization of Titanium Dioxide thin films produced by RF plasma sputtering technique for photocatalytic applications 1-gen-2015 Inzoli, F; Angella, G; Caniello, R; Canetti, M; Pedroni, M; Vassallo, E
Characterization of Titanium Dioxide thin films produced by RF plasma sputtering technique for photocatalytic applications 1-gen-2015 Inzoli, F; Angella, G; Caniello, R; Canetti, M; Pedroni, M; Vassallo, E
Effects of Nitrogen Concentration on Microstructure of Tungsten Coatings Synthesized by Plasma Sputtering Method 1-gen-2015 Vassallo, E; Angella, G; Caniello, R; Deambrosis, S; Inzoli, F; Miorin, E; Pedroni, M
Formation of nanostructures in silicon by a maskless plasma process 1-gen-2015 M. Pedroni; E. Vassallo; F. Inzoli; R. Caniello; A. Cremona; F. Ghezzi; L. Laguardia; V. Spampinato
Investigation on FTU dust and on the origin of ferromagnetic and lithiated grains 1-gen-2015 De Angeli, M; Laguardia, L; Maddaluno, G; Perelli Cippo, E; Ripamonti, D; Apicella, Ml; Bressan, C; Caniello, R; Conti, C; Ghezzi, F; Grosso, G; Mazzitelli, G
Retention of nanocrystalline WNx layers exposed to high-fluence deuterium plasmas 1-gen-2015 Vassallo, E; Caniello, R; Angella, G; Dellasega, D; Granucci, G; Mellera, V; Minelli, D; Pedroni, M; Ricci, D; Rigato, V; Passoni, M
Surface diagnostics of nanostructured silicon by CF4/H2 plasmas 1-gen-2015 Caniello, R; Vassallo, E; Cremona, A; Ghezzi, F; Laguardia, L; Pedroni, M; Spampinato, V; Anderle, M