Carrier confinement effects observed in the normal-state electrical transport of electron-doped cuprate trilayers

SrCuO2/Sr0.9La0.1CuO2/SrCuO2 trilayers were grown by oxide-molecular beam epitaxy. The thicknesses of the top and bottom SrCuO2 layers were fixed, while the thickness of the infinite-layer electron-doped cuprate Sr0.9La0.1CuO2 central layer was systematically changed. Transmission electron microscopy, x-ray reflectivity and x-ray diffraction measurements were performed to assess the sample quality and the abruptness of the interfaces. Electrical transport measurements as a function of temperature and as a function of central layer thickness, confirm that the normal state properties of the trilayers are altered by the confinement of the charge carriers in the central layer.