The effective carrier diffusion length and the local mobility have been measured in graphene layers in the inferior mesoscopic regime. The measurements were carried out probing the electrical properties at nanoscale by using scanning capacitance microscopy. The local variations in the quantum capacitance can be measured and from them the effective polarised area can be determined. As a consequence the local density of states and the other local transport parameters can be obtained.

Mesoscopic Transport Properties in Exfoliated Graphene on SiO2/Si

Raineri V;Giannazzo F
2011

Abstract

The effective carrier diffusion length and the local mobility have been measured in graphene layers in the inferior mesoscopic regime. The measurements were carried out probing the electrical properties at nanoscale by using scanning capacitance microscopy. The local variations in the quantum capacitance can be measured and from them the effective polarised area can be determined. As a consequence the local density of states and the other local transport parameters can be obtained.
2011
Istituto per la Microelettronica e Microsistemi - IMM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/38107
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