GRECO, GIUSEPPE
GRECO, GIUSEPPE
Istituto per la Microelettronica e Microsistemi - IMM
Design of Three Residues Peptides against SARS-CoV-2 Infection
2022 Zannella, Carla; Chianese, Annalisa; Greco, Giuseppe; Santella, Biagio; Squillaci, Giuseppe; Monti, Alessandra; Doti, Nunzianna; Sanna, Giuseppina; Manzin, Aldo; Morana, Alessandra; De Filippis, Anna; D'Angelo, Gianni; Palmieri, Francesco; Franci, Gianluigi; Galdiero., Massimiliano
The Electronic Nose: Review on Sensor Arrays and Future Perspectives
2022 Sberveglieri, Giorgio; Greco, Giuseppe; Genzardi, Dario; Nunez Carmona, E; Pezzottini, Simone; Sberveglieri, Veronica
Electrical properties of inhomogeneous tungsten carbide Schottky barrier on 4H-SiC
2021 Vivona, M. ; Greco, G. ; Bellocchi, G. ; Zumbo, L. ; Di Franco, S. ; Saggio, M. ; Rascuna, S. ; Roccaforte, F.
How Coffee Capsules Affect the Volatilome in Espresso Coffee
2021 Greco, Giuseppe; Nunez Carmona, E.; Abbatangelo, Marco; Fava, Patrizia; Sberveglieri, Veronica
Nanoscale structural and electrical properties of graphene grown on AlGaN by catalyst-free chemical vapor deposition
2021 Giannazzo, F; Dagher, R; Schiliro, E; Panasci, S E; Greco, G; Nicotra, G; Roccaforte, F; Agnello, S; Brault, J; Cordier, Y; Michon, A
Active dopant profiling and Ohmic contacts behavior in degenerate n-type implanted silicon carbide
2020 Spera, Monia; Greco, Giuseppe; Severino, Andrea; Vivona, Marilena; Fiorenza, Patrick; Giannazzo, Filippo; Roccaforte, Fabrizio
Conductive atomic force microscopy of semiconducting transition metal dichalcogenides and heterostructures
2020 Giannazzo, F.; Schiliro', E.; Greco, G.; Roccaforte, F.
Correlating electron trapping and structural defects in Al2O3 thin films deposited by plasma enhanced atomic layer deposition
2020 Schiliro, Emanuela; Fiorenza, Patrick; Bongiorno, Corrado; Spinella, Corrado; DI FRANCO, Salvatore; Greco, Giuseppe; LO NIGRO, Raffaella; Roccaforte, Fabrizio
Current transport mechanisms in au-free metallizations for cmos compatible gan hemt technology
2020 Roccaforte, F; Spera, M; Di Franco, S; Nigro, Rl; Fiorenza, P; Giannazzo, F; Iucolano, F; Greco, G
Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy
2020 Filippo Giannazzo ; Giuseppe Greco ; Salvatore Di Franco ; Patrick Fiorenza ; Ioannis Deretzis ; Antonino La Magna ; Corrado Bongiorno ; Massimo Zimbone ; Francesco La Via ; Marcin Zielinski ; Fabrizio Roccaforte
Normally-off HEMT transistor with selective generation of 2DEG channel, and manufacturing method thereof
2020 Iucolano, Ferdinando; Greco, Giuseppe; Roccaforte, Fabrizio
Technologies for normally-off GaN HEMTs
2020 Greco, Giuseppe; Fiorenza, Patrick; Iucolano, Ferdinando; Roccaforte, Fabrizio
Thermal annealing effect on electrical and structural properties of Tungsten Carbide Schottky contacts on AlGaN/GaN heterostructures
2020 Greco, G. ; Di Franco, S. ; Bongiorno, C. ; Grzanka, E. ; Leszczynski, M. ; Giannazzo, F. ; Roccaforte, F.
An Overview of Normally-Off GaN-Based High Electron Mobility Transistors
2019 Roccaforte, Fabrizio; Greco, Giuseppe; Fiorenza, Patrick; Iucolano, Ferdinando
Barrier inhomogeneity in vertical Schottky diodes on free standing gallium nitride
2019 Roccaforte, F; Giannazzo, F; Alberti, A; Spera, M; Cannas, M; Cora, I; Pecz, B; Iucolano, F; Greco, G
Direct Probing of Grain Boundary Resistance in Chemical Vapor Deposition-Grown Monolayer MoS2 by Conductive Atomic Force Microscopy
2019 Giannazzo F.; Bosi M.; Fabbri F.; Schiliro E.; Greco G.; Roccaforte F.
Effect of high temperature annealing (T > 1650 degrees C) on the morphological and electrical properties of p-type implanted 4H-SiC layers
2019 Spera, M; Corso, D; Di Franco, S; Greco, G; Severino, A; Fiorenza, P; Giannazzo, F; Roccaforte, F
Electrical properties of thermal oxide on 3C-SIC layers grown on silicon
2019 Fiorenza, P; Greco, G; Di Franco, S; Giannazzo, F; Monnoye, S; Zielinski, M; La Via, F; Roccaforte, F
Extensive Fermi-Level Engineering for Graphene through the Interaction with Aluminum Nitrides and Oxides
2019 Sciuto, Alberto; LA MAGNA, Antonino; Angilella Giuseppe, G N; Pucci, Renato; Greco, Giuseppe; Roccaforte, Fabrizio; Giannazzo, Filippo; Deretzis, Ioannis
Growth and characterization of thin Al-rich AlGaN on bulk GaN as an emitter-base barrier for hot electron transistor
2019 Prystawko, Pawel; Giannazzo, F; Krysko, M; Smalckoziorowska, J; Schiliro, E; Greco, G; Roccaforte, F; Leszczynski, M
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Design of Three Residues Peptides against SARS-CoV-2 Infection | 1-gen-2022 | Zannella, Carla; Chianese, Annalisa; Greco, Giuseppe; Santella, Biagio; Squillaci, Giuseppe; Monti, Alessandra; Doti, Nunzianna; Sanna, Giuseppina; Manzin, Aldo; Morana, Alessandra; De Filippis, Anna; D'Angelo, Gianni; Palmieri, Francesco; Franci, Gianluigi; Galdiero., Massimiliano | |
| The Electronic Nose: Review on Sensor Arrays and Future Perspectives | 1-gen-2022 | Sberveglieri, Giorgio; Greco, Giuseppe; Genzardi, Dario; Nunez Carmona, E; Pezzottini, Simone; Sberveglieri, Veronica | |
| Electrical properties of inhomogeneous tungsten carbide Schottky barrier on 4H-SiC | 1-gen-2021 | Vivona, M. ; Greco, G. ; Bellocchi, G. ; Zumbo, L. ; Di Franco, S. ; Saggio, M. ; Rascuna, S. ; Roccaforte, F. | |
| How Coffee Capsules Affect the Volatilome in Espresso Coffee | 1-gen-2021 | Greco, Giuseppe; Nunez Carmona, E.; Abbatangelo, Marco; Fava, Patrizia; Sberveglieri, Veronica | |
| Nanoscale structural and electrical properties of graphene grown on AlGaN by catalyst-free chemical vapor deposition | 1-gen-2021 | Giannazzo, F; Dagher, R; Schiliro, E; Panasci, S E; Greco, G; Nicotra, G; Roccaforte, F; Agnello, S; Brault, J; Cordier, Y; Michon, A | |
| Active dopant profiling and Ohmic contacts behavior in degenerate n-type implanted silicon carbide | 1-gen-2020 | Spera, Monia; Greco, Giuseppe; Severino, Andrea; Vivona, Marilena; Fiorenza, Patrick; Giannazzo, Filippo; Roccaforte, Fabrizio | |
| Conductive atomic force microscopy of semiconducting transition metal dichalcogenides and heterostructures | 1-gen-2020 | Giannazzo, F.; Schiliro', E.; Greco, G.; Roccaforte, F. | |
| Correlating electron trapping and structural defects in Al2O3 thin films deposited by plasma enhanced atomic layer deposition | 1-gen-2020 | Schiliro, Emanuela; Fiorenza, Patrick; Bongiorno, Corrado; Spinella, Corrado; DI FRANCO, Salvatore; Greco, Giuseppe; LO NIGRO, Raffaella; Roccaforte, Fabrizio | |
| Current transport mechanisms in au-free metallizations for cmos compatible gan hemt technology | 1-gen-2020 | Roccaforte, F; Spera, M; Di Franco, S; Nigro, Rl; Fiorenza, P; Giannazzo, F; Iucolano, F; Greco, G | |
| Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy | 1-gen-2020 | Filippo Giannazzo ; Giuseppe Greco ; Salvatore Di Franco ; Patrick Fiorenza ; Ioannis Deretzis ; Antonino La Magna ; Corrado Bongiorno ; Massimo Zimbone ; Francesco La Via ; Marcin Zielinski ; Fabrizio Roccaforte | |
| Normally-off HEMT transistor with selective generation of 2DEG channel, and manufacturing method thereof | 1-gen-2020 | Iucolano, Ferdinando; Greco, Giuseppe; Roccaforte, Fabrizio | |
| Technologies for normally-off GaN HEMTs | 1-gen-2020 | Greco, Giuseppe; Fiorenza, Patrick; Iucolano, Ferdinando; Roccaforte, Fabrizio | |
| Thermal annealing effect on electrical and structural properties of Tungsten Carbide Schottky contacts on AlGaN/GaN heterostructures | 1-gen-2020 | Greco, G. ; Di Franco, S. ; Bongiorno, C. ; Grzanka, E. ; Leszczynski, M. ; Giannazzo, F. ; Roccaforte, F. | |
| An Overview of Normally-Off GaN-Based High Electron Mobility Transistors | 1-gen-2019 | Roccaforte, Fabrizio; Greco, Giuseppe; Fiorenza, Patrick; Iucolano, Ferdinando | |
| Barrier inhomogeneity in vertical Schottky diodes on free standing gallium nitride | 1-gen-2019 | Roccaforte, F; Giannazzo, F; Alberti, A; Spera, M; Cannas, M; Cora, I; Pecz, B; Iucolano, F; Greco, G | |
| Direct Probing of Grain Boundary Resistance in Chemical Vapor Deposition-Grown Monolayer MoS2 by Conductive Atomic Force Microscopy | 1-gen-2019 | Giannazzo F.; Bosi M.; Fabbri F.; Schiliro E.; Greco G.; Roccaforte F. | |
| Effect of high temperature annealing (T > 1650 degrees C) on the morphological and electrical properties of p-type implanted 4H-SiC layers | 1-gen-2019 | Spera, M; Corso, D; Di Franco, S; Greco, G; Severino, A; Fiorenza, P; Giannazzo, F; Roccaforte, F | |
| Electrical properties of thermal oxide on 3C-SIC layers grown on silicon | 1-gen-2019 | Fiorenza, P; Greco, G; Di Franco, S; Giannazzo, F; Monnoye, S; Zielinski, M; La Via, F; Roccaforte, F | |
| Extensive Fermi-Level Engineering for Graphene through the Interaction with Aluminum Nitrides and Oxides | 1-gen-2019 | Sciuto, Alberto; LA MAGNA, Antonino; Angilella Giuseppe, G N; Pucci, Renato; Greco, Giuseppe; Roccaforte, Fabrizio; Giannazzo, Filippo; Deretzis, Ioannis | |
| Growth and characterization of thin Al-rich AlGaN on bulk GaN as an emitter-base barrier for hot electron transistor | 1-gen-2019 | Prystawko, Pawel; Giannazzo, F; Krysko, M; Smalckoziorowska, J; Schiliro, E; Greco, G; Roccaforte, F; Leszczynski, M |