GIANNAZZO, FILIPPO
GIANNAZZO, FILIPPO
Istituto per la Microelettronica e Microsistemi - IMM
Direct atomic layer deposition of ultra-thin Al2O3 and HfO2 films on gold-supported monolayer MoS2
2023 Schiliro', E; Panasci, S. E.; Mio, Am; Nicotra, G; Agnello, S; Pecz, B; Z Radnoczi, Gy; Deretzis, I; La Magna, A.; Roccaforte, F; Lo Nigro, R.; Giannazzo, F
Role of density gradients in the growth dynamics of 2-dimensional MoS2 using liquid phase molybdenum precursor in chemical vapor deposition
2023 Esposito, F; Bosi, M; Attolini, G; Rossi, F; Panasci, SALVATORE ETHAN; Fiorenza, P; Giannazzo, F; Fabbri, F; Seravalli, L
Electrical passivation of stacking-fault crystalline defects in MOS capacitors on cubic silicon carbide (3C-SiC) by post-deposition annealing
2022 Fiorenza P.; Maiolo L.; Fortunato G.; Zielinski M.; La Via F.; Giannazzo F.; Roccaforte F.
Materials and Processes for Schottky Contacts on Silicon Carbide
2022 Vivona M.; Giannazzo F.; Roccaforte F.
Gold nanoparticle assisted synthesis of MoS2 monolayers by chemical vapor deposition
2021 Seravalli, L; Bosi, M; Fiorenza, P; Panasci, Se; Orsi, D; Rotunno, E; Cristofolini, L; Rossi, F; Giannazzo, F; Fabbri, F
Indium Nitride at the 2D Limit
2021 Pecz; Bela;Nicotra; Giuseppe;Giannazzo; Filippo;Yakimova; Rositsa;Koos; Antal;KakanakovaGeorgieva; Anelia
MOCVD of AlN on epitaxial graphene at extreme temperatures
2021 Kakanakovageorgieva, Anelia; Ivanov Ivan, G; Suwannaharn, Nattamon; Hsu, Chihwei; Cora, Ildiko; Pecz, Bela; Giannazzo, Filippo; Sangiovanni Davide, G; Gueorguiev Gueorgui, K
Nanoscale structural and electrical properties of graphene grown on AlGaN by catalyst-free chemical vapor deposition
2021 Giannazzo, F; Dagher, R; Schiliro, E; Panasci, S E; Greco, G; Nicotra, G; Roccaforte, F; Agnello, S; Brault, J; Cordier, Y; Michon, A
Active dopant profiling and Ohmic contacts behavior in degenerate n-type implanted silicon carbide
2020 Spera, Monia; Greco, Giuseppe; Severino, Andrea; Vivona, Marilena; Fiorenza, Patrick; Giannazzo, Filippo; Roccaforte, Fabrizio
Aluminum oxide nucleation in the early stages of atomic layer deposition on epitaxial graphene
2020 Schiliro, E; Lo Nigro, R; Panasci, Se; Gelardi, Fm; Agnello, S; Yakimova, R; Roccaforte, F; Giannazzo, F
Atomic layer deposition of high-k insulators on epitaxial graphene: A review
2020 Giannazzo, F; Schiliro, E; Lo Nigro, R; Roccaforte, F; Yakimova, R
Conductive atomic force microscopy of semiconducting transition metal dichalcogenides and heterostructures
2020 Giannazzo, F.; Schiliro', E.; Greco, G.; Roccaforte, F.
Current transport mechanisms in au-free metallizations for cmos compatible gan hemt technology
2020 Roccaforte, F; Spera, M; Di Franco, S; Nigro, Rl; Fiorenza, P; Giannazzo, F; Iucolano, F; Greco, G
Dynamic Modification of Fermi Energy in Single-Layer Graphene by Photoinduced Electron Transfer from Carbon Dots
2020 Armano, Angelo; Buscarino, Gianpiero; Messina, Fabrizio; Sciortino, Alice; Cannas, Marco; Gelardi Franco, Mario; Giannazzo, Filippo; Schiliro', Emanuela; Agnello, Simonpietro
Genesis and evolution of extended defects: The role of evolving interface instabilities in cubic SiC
2020 Giuseppe Fisicaro ; Corrado Bongiorno ; Ioannis Deretzis ; Filippo Giannazzo ; Francesco La Via ; Fabrizio Roccaforte ; Marcin Zielinski ; Massimo Zimbone ; Antonino La Magna
Identification of two trapping mechanisms responsible of the threshold voltage variation in SiO2/4H-SiC MOSFETs
2020 Fiorenza, Patrick; Giannazzo, Filippo; Cascino, Salvatore; Saggio, Mario; Roccaforte, Fabrizio
Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy
2020 Filippo Giannazzo ; Giuseppe Greco ; Salvatore Di Franco ; Patrick Fiorenza ; Ioannis Deretzis ; Antonino La Magna ; Corrado Bongiorno ; Massimo Zimbone ; Francesco La Via ; Marcin Zielinski ; Fabrizio Roccaforte
Improved Electrical and Structural Stability in HTL-Free Perovskite Solar Cells by Vacuum Curing Treatment
2020 Valastro, Salvatore; Smecca, Emanuele; Sanzaro, Salvatore; Giannazzo, Filippo; Deretzis, Ioannis; LA MAGNA, Antonino; Numata, Youhei; Jena Ajay, Kumar; Miyasaka, Tsutomu; Gagliano, Antonio; Alberti, Alessandra
Nanoscale insights on the origin of the power mosfets breakdown after extremely long high temperature reverse bias stress
2020 Fiorenza, P; Alessandrino, M; Carbone, B; Di Martino, C; Russo, A; Saggio, M; Venuto, C; Zanetti, E; Bongiorno, C; Giannazzo, F; Roccaforte, F
Nanoscale phenomena ruling deposition and intercalation of AlN at the graphene/SiC interface
2020 Kakanakovageorgieva, Anelia; Gueorguiev Gueorgui, K; Sangiovanni Davide, G; Suwannaharn, Nattamon; Ivanov Ivan, G; Cora, Ildiko; Pecz, Bela; Nicotra, Giuseppe; Giannazzo, Filippo
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Direct atomic layer deposition of ultra-thin Al2O3 and HfO2 films on gold-supported monolayer MoS2 | 1-gen-2023 | Schiliro', E; Panasci, S. E.; Mio, Am; Nicotra, G; Agnello, S; Pecz, B; Z Radnoczi, Gy; Deretzis, I; La Magna, A.; Roccaforte, F; Lo Nigro, R.; Giannazzo, F | |
| Role of density gradients in the growth dynamics of 2-dimensional MoS2 using liquid phase molybdenum precursor in chemical vapor deposition | 1-gen-2023 | Esposito, F; Bosi, M; Attolini, G; Rossi, F; Panasci, SALVATORE ETHAN; Fiorenza, P; Giannazzo, F; Fabbri, F; Seravalli, L | |
| Electrical passivation of stacking-fault crystalline defects in MOS capacitors on cubic silicon carbide (3C-SiC) by post-deposition annealing | 1-gen-2022 | Fiorenza P.; Maiolo L.; Fortunato G.; Zielinski M.; La Via F.; Giannazzo F.; Roccaforte F. | |
| Materials and Processes for Schottky Contacts on Silicon Carbide | 1-gen-2022 | Vivona M.; Giannazzo F.; Roccaforte F. | |
| Gold nanoparticle assisted synthesis of MoS2 monolayers by chemical vapor deposition | 1-gen-2021 | Seravalli, L; Bosi, M; Fiorenza, P; Panasci, Se; Orsi, D; Rotunno, E; Cristofolini, L; Rossi, F; Giannazzo, F; Fabbri, F | |
| Indium Nitride at the 2D Limit | 1-gen-2021 | Pecz; Bela;Nicotra; Giuseppe;Giannazzo; Filippo;Yakimova; Rositsa;Koos; Antal;KakanakovaGeorgieva; Anelia | |
| MOCVD of AlN on epitaxial graphene at extreme temperatures | 1-gen-2021 | Kakanakovageorgieva, Anelia; Ivanov Ivan, G; Suwannaharn, Nattamon; Hsu, Chihwei; Cora, Ildiko; Pecz, Bela; Giannazzo, Filippo; Sangiovanni Davide, G; Gueorguiev Gueorgui, K | |
| Nanoscale structural and electrical properties of graphene grown on AlGaN by catalyst-free chemical vapor deposition | 1-gen-2021 | Giannazzo, F; Dagher, R; Schiliro, E; Panasci, S E; Greco, G; Nicotra, G; Roccaforte, F; Agnello, S; Brault, J; Cordier, Y; Michon, A | |
| Active dopant profiling and Ohmic contacts behavior in degenerate n-type implanted silicon carbide | 1-gen-2020 | Spera, Monia; Greco, Giuseppe; Severino, Andrea; Vivona, Marilena; Fiorenza, Patrick; Giannazzo, Filippo; Roccaforte, Fabrizio | |
| Aluminum oxide nucleation in the early stages of atomic layer deposition on epitaxial graphene | 1-gen-2020 | Schiliro, E; Lo Nigro, R; Panasci, Se; Gelardi, Fm; Agnello, S; Yakimova, R; Roccaforte, F; Giannazzo, F | |
| Atomic layer deposition of high-k insulators on epitaxial graphene: A review | 1-gen-2020 | Giannazzo, F; Schiliro, E; Lo Nigro, R; Roccaforte, F; Yakimova, R | |
| Conductive atomic force microscopy of semiconducting transition metal dichalcogenides and heterostructures | 1-gen-2020 | Giannazzo, F.; Schiliro', E.; Greco, G.; Roccaforte, F. | |
| Current transport mechanisms in au-free metallizations for cmos compatible gan hemt technology | 1-gen-2020 | Roccaforte, F; Spera, M; Di Franco, S; Nigro, Rl; Fiorenza, P; Giannazzo, F; Iucolano, F; Greco, G | |
| Dynamic Modification of Fermi Energy in Single-Layer Graphene by Photoinduced Electron Transfer from Carbon Dots | 1-gen-2020 | Armano, Angelo; Buscarino, Gianpiero; Messina, Fabrizio; Sciortino, Alice; Cannas, Marco; Gelardi Franco, Mario; Giannazzo, Filippo; Schiliro', Emanuela; Agnello, Simonpietro | |
| Genesis and evolution of extended defects: The role of evolving interface instabilities in cubic SiC | 1-gen-2020 | Giuseppe Fisicaro ; Corrado Bongiorno ; Ioannis Deretzis ; Filippo Giannazzo ; Francesco La Via ; Fabrizio Roccaforte ; Marcin Zielinski ; Massimo Zimbone ; Antonino La Magna | |
| Identification of two trapping mechanisms responsible of the threshold voltage variation in SiO2/4H-SiC MOSFETs | 1-gen-2020 | Fiorenza, Patrick; Giannazzo, Filippo; Cascino, Salvatore; Saggio, Mario; Roccaforte, Fabrizio | |
| Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy | 1-gen-2020 | Filippo Giannazzo ; Giuseppe Greco ; Salvatore Di Franco ; Patrick Fiorenza ; Ioannis Deretzis ; Antonino La Magna ; Corrado Bongiorno ; Massimo Zimbone ; Francesco La Via ; Marcin Zielinski ; Fabrizio Roccaforte | |
| Improved Electrical and Structural Stability in HTL-Free Perovskite Solar Cells by Vacuum Curing Treatment | 1-gen-2020 | Valastro, Salvatore; Smecca, Emanuele; Sanzaro, Salvatore; Giannazzo, Filippo; Deretzis, Ioannis; LA MAGNA, Antonino; Numata, Youhei; Jena Ajay, Kumar; Miyasaka, Tsutomu; Gagliano, Antonio; Alberti, Alessandra | |
| Nanoscale insights on the origin of the power mosfets breakdown after extremely long high temperature reverse bias stress | 1-gen-2020 | Fiorenza, P; Alessandrino, M; Carbone, B; Di Martino, C; Russo, A; Saggio, M; Venuto, C; Zanetti, E; Bongiorno, C; Giannazzo, F; Roccaforte, F | |
| Nanoscale phenomena ruling deposition and intercalation of AlN at the graphene/SiC interface | 1-gen-2020 | Kakanakovageorgieva, Anelia; Gueorguiev Gueorgui, K; Sangiovanni Davide, G; Suwannaharn, Nattamon; Ivanov Ivan, G; Cora, Ildiko; Pecz, Bela; Nicotra, Giuseppe; Giannazzo, Filippo |