LA VIA, FRANCESCO
LA VIA, FRANCESCO
Istituto per la Microelettronica e Microsistemi - IMM
Free-Standing 3C-SiC P-Type Doping by Al Ion Implantation
2024 Canino, M.; Torregrosa, F.; Zielinski, M.; Boldrini, V.; Bidini, C.; Russo, M.; Maccagnani, P.; La Via, F.
Stress Fields Distribution and Simulation in 3C-SiC Resonators
2024 Scuderi, Viviana; Muoio, Annamaria; Sapienza, Sergio; Ferri, Matteo; Belsito, Luca; Roncaglia, Alberto; La Via, Francesco
Correlation between Q-Factor and Residual Stress in Epitaxial 3C-SiC Double-Clamped Beam Resonators
2023 Sapienza, Sergio; Ferri, Matteo; Belsito, Luca; Marini, Diego; Zielinski, Marcin; La Via, Francesco; Roncaglia, Alberto
Measuring Techniques for the Semiconductor’s Parameters
2023 Alberti, Alessandra; Giannazzo, Filippo; LA VIA, Francesco; Lombardo, Salvatore; Mio, Antonio M.; Nicotra, Giuseppe; Privitera, Stefania; Reitano, Riccardo; Roccaforte, Fabrizio; Spinella, Corrado; Rimini, Emanuele
Fast growth rate epitaxy by chloride precursors
2012 Francesco La Via
SiC Films and Coatings: Amorphous, Polycrystalline, and Single Crystal Forms
2012 Locke, C W; Severino, A; La Via, F; Reyes, M; Register, J; Saddow, S E
SiC Films and Coatings: Amorphous, Polycrystalline, Single Crystal Forms
2012 Locke, Cw; Reyes, ; Register, J; Saddow, Se; A, Severino; LA VIA, Francesco
Ohmic contacts to SiC
2006 F. Roccaforte; F. La Via; V. Raineri
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Free-Standing 3C-SiC P-Type Doping by Al Ion Implantation | 1-gen-2024 | Canino, M.; Torregrosa, F.; Zielinski, M.; Boldrini, V.; Bidini, C.; Russo, M.; Maccagnani, P.; La Via, F. | |
| Stress Fields Distribution and Simulation in 3C-SiC Resonators | 1-gen-2024 | Scuderi, Viviana; Muoio, Annamaria; Sapienza, Sergio; Ferri, Matteo; Belsito, Luca; Roncaglia, Alberto; La Via, Francesco | |
| Correlation between Q-Factor and Residual Stress in Epitaxial 3C-SiC Double-Clamped Beam Resonators | 1-gen-2023 | Sapienza, Sergio; Ferri, Matteo; Belsito, Luca; Marini, Diego; Zielinski, Marcin; La Via, Francesco; Roncaglia, Alberto | |
| Measuring Techniques for the Semiconductor’s Parameters | 1-gen-2023 | Alberti, Alessandra; Giannazzo, Filippo; LA VIA, Francesco; Lombardo, Salvatore; Mio, Antonio M.; Nicotra, Giuseppe; Privitera, Stefania; Reitano, Riccardo; Roccaforte, Fabrizio; Spinella, Corrado; Rimini, Emanuele | |
| Fast growth rate epitaxy by chloride precursors | 1-gen-2012 | Francesco La Via | |
| SiC Films and Coatings: Amorphous, Polycrystalline, and Single Crystal Forms | 1-gen-2012 | Locke, C W; Severino, A; La Via, F; Reyes, M; Register, J; Saddow, S E | |
| SiC Films and Coatings: Amorphous, Polycrystalline, Single Crystal Forms | 1-gen-2012 | Locke, Cw; Reyes, ; Register, J; Saddow, Se; A, Severino; LA VIA, Francesco | |
| Ohmic contacts to SiC | 1-gen-2006 | F. Roccaforte; F. La Via; V. Raineri |