A multiplicity of chemical (structure, composition, point and extended defects, impurities, etc.) and physical (car- rierconcentration,mobility,lifetime,bandgap,corelevel energies, etc.) parameters characterize the behavior of semiconductors: some of them are more relevant than others according to the considered semiconductor and its use.

Measuring Techniques for the Semiconductor’s Parameters

Alessandra Alberti;Filippo Giannazzo;Francesco La Via;Salvatore Lombardo;Antonio M. Mio;Giuseppe Nicotra;Stefania Privitera;Fabrizio Roccaforte;Corrado Spinella;Emanuele Rimini
2023

Abstract

A multiplicity of chemical (structure, composition, point and extended defects, impurities, etc.) and physical (car- rierconcentration,mobility,lifetime,bandgap,corelevel energies, etc.) parameters characterize the behavior of semiconductors: some of them are more relevant than others according to the considered semiconductor and its use.
2023
Istituto per la Microelettronica e Microsistemi - IMM
9783030798260
9783030798277
Semiconductor, Measuring Techniques
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/524025
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