LA VIA, FRANCESCO

LA VIA, FRANCESCO  

Istituto per la Microelettronica e Microsistemi - IMM  

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Titolo Data di pubblicazione Autore(i) File
Laser crystallization of amorphous TiO2 on polymer 1-gen-2023 Zimbone, Massimo; Cantarella, Maria; Giuffrida, Federico; LA VIA, Francesco; Privitera, Vittorio; Napolitani, Enrico; Impellizzeri, Giuliana
Electrical passivation of stacking-fault crystalline defects in MOS capacitors on cubic silicon carbide (3C-SiC) by post-deposition annealing 1-gen-2022 Fiorenza P.; Maiolo L.; Fortunato G.; Zielinski M.; La Via F.; Giannazzo F.; Roccaforte F.
"Si(n)Ce You Are a Driver": A PCTO Experience about Semiconductor Physic in Italy 1-gen-2021 Mariaconcetta Canino; Laura Vivani; Francesco La Via
Detector Response to D-D Neutrons and Stability Measurements with 4H Silicon Carbide Detectors 1-gen-2021 Kushoro, Matteo Hakeem; Rebai, Marica; Tardocchi, Marco; Altana, Carmen; Cazzaniga, Carlo; De Marchi, Eliana; La Via, Francesco; Meda, Laura; Meli, Alessandro; Parisi, Miriam; Perelli Cippo, Enrico; Pillon, Mario; Trotta, Antonio; Tudisco, Salvo; Gorini, Giuseppe
Epitaxial Growth and Characterization of 4H-SiC for Neutron Detection Applications 1-gen-2021 Meli, Alessandro; Muoio, Annamaria; Trotta, Antonio; Meda, Laura; Parisi, Miriam; La Via, Francesco
Silicon Carbide and MRI: Towards Developing a MRI Safe Neural Interface 1-gen-2021 Beygi, Mohammad; DominguezViqueira, William; Feng, Chenyin; Mumcu, Gokhan; Frewin, Christopher L.; La Via, Francesco; Saddow, Stephen E.
Characterization of 4H-and 6H-Like Stacking Faults in Cross Section of 3C-SiC Epitaxial Layer by Room-Temperature mu-Photoluminescence and mu-Raman Analysis 1-gen-2020 Scuderi, Viviana; Calabretta, Cristiano; Anzalone, Ruggero; Mauceri, Marco; La Via, Francesco
Generation and Termination of Stacking Faults by Inverted Domain Boundaries in 3C-SiC 1-gen-2020 Zimbone, Massimo; Barbagiovanni Eric, Gasparo; Bongiorno, Corrado; Calabretta, Cristiano; Calcagno, Lucia; Fisicaro, Giuseppe; LA MAGNA, Antonino; LA VIA, Francesco
Genesis and evolution of extended defects: The role of evolving interface instabilities in cubic SiC 1-gen-2020 Giuseppe Fisicaro ; Corrado Bongiorno ; Ioannis Deretzis ; Filippo Giannazzo ; Francesco La Via ; Fabrizio Roccaforte ; Marcin Zielinski ; Massimo Zimbone ; Antonino La Magna
Silicon Carbide characterization at the n_TOF spallation source with quasi-monoenergetic fast neutrons 1-gen-2020 Kushoro, M H; Rebai, M; Dicorato, M; Rigamonti, D; Altana, C; Cazzaniga, C; Croci, G; Gorini, G; Lanzalone, G; La Via, F; Muoio, A; Muraro, A; Murtas, F; Cippo, E Perelli; Tardocchi, M; Barbagallo, M; Mingrone, F; Tudisco, S
Silicon Carbide devices for radiation detection and measurements 1-gen-2020 La Via F.; Tudisco S.; Altana C.; Boscardin M.; Ciampi C.; Cirrone G.A.P.; Fazzi A.; Giove D.; Gorini G.; Lanzalone G.; Muoio A.; Pasquali G.; Petringa G.; Puglia S.M.R.; Rebai M.; Santangelo A.; Trifiro A.
3C-SiC grown on Si by using a Si1-xGex buffer layer 1-gen-2019 Zimbone, M; Zielinski, M; Barbagiovanni, E G; Calabretta, C; La Via, F
3C-SiC Growth on Inverted Silicon Pyramids Patterned Substrate 1-gen-2019 Zimbone, Massimo; Zielinski, Marcin; Bongiorno, Corrado; Calabretta, Cristiano; Anzalone, Ruggero; Scalese, Silvia; Fisicaro, Giuseppe; LA MAGNA, Antonino; Mancarella, Fulvio; LA VIA, Francesco
Fabrication of a Monolithic Implantable Neural Interface from Cubic Silicon Carbide 1-gen-2019 Beygi, Mohammad; Bentley John, T; Frewin Christopher, L; Kuliasha Cary, A; Takshi, Arash; Bernardin Evans, K; LA VIA, Francesco; Saddow Stephen, E
Growth and Coalescence of 3C-SiC on Si(111) Micro-Pillars by a Phase-Field Approach 1-gen-2019 Masullo, Marco; Bergamaschini, Roberto; Albani, Marco; Kreiliger, Thomas; Mauceri, Marco; Crippa, Danilo; LA VIA, Francesco; Montalenti, Francesco; von Kaenel, Hans; Miglio, Leo
Growth of Large-Area, Stress-Free, and Bulk-Like 3C-SiC (100) Using 3C-SiC-on-Si in Vapor Phase Growth 1-gen-2019 Schuh, Philipp; LA VIA, Francesco; Mauceri, Marco; Zielinski, Marcin; Wellmann Peter, J
Laser Annealing of P and Al Implanted 4H-SiC Epitaxial Layers 1-gen-2019 Calabretta, Cristiano; Agati, Marta; Zimbone, Massimo; Boninelli, SIMONA MARIA CRISTINA; Castiello, Andrea; Pecora, Alessandro; Fortunato, Guglielmo; Calcagno, Lucia; Torrisi, Lorenzo; LA VIA, Francesco
Limitations during Vapor Phase Growth of Bulk (100) 3C-SiC Using 3C-SiC-on-SiC Seeding Stacks 1-gen-2019 Schuh, Philipp; Steiner, Johannes; La Via, Francesco; Mauceri, Marco; Zielinski, Marcin; Wellmann, Peter J.
Nuclear fragment identification with Delta E-E telescopes exploiting silicon carbide detectors 1-gen-2019 Ciampi, C; Pasquali, G; Altana, C; Bini, M; Boscardin, M; Calcagno, L; Casini, G; Cirrone, G A P; Fazzi, A; Giove, D; Gorini, G; Labate, L; La Via, F; Lanzalone, G; Litrico, G; Muoio, A; Ottanelli, P; Poggi, G; Puglia, S M R; Rebai, M; Ronchin, S; Santangelo, A; Stefanini, A A; Trifiro, A; Tudisco, S; Zimbone, M
Simulation of the Growth Kinetics in Group IV Compound Semiconductors 1-gen-2019 La Magna, Antonino; Alberti, Alessandra; Barbagiovanni, Erik; Bongiorno, Corrado; Cascio, Michele; Deretzis, Ioannis; La Via, Francesco; Smecca, Emanuele