CNR Institutional Research Information System

PEREGO, MICHELE
 Distribuzione geografica
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Continente #
AS - Asia 38
EU - Europa 12
NA - Nord America 2
Totale 52
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Nazione #
CN - Cina 25
KR - Corea 10
IT - Italia 9
SG - Singapore 3
IE - Irlanda 2
US - Stati Uniti d'America 2
GB - Regno Unito 1
Totale 52
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Città #
Guangzhou 21
Seoul 10
Bologna 2
Dublin 2
Novara 2
London 1
Naples 1
Singapore 1
Viterbo 1
Totale 41
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Nome #
Plasma-Assisted Atomic Layer Deposition of IrO2 for Neuroelectronics 4
Characterization of biodegradable polybutylene succinate modified by sequential infiltration of Al2O3 4
Sequential Infiltration Synthesis of Al2O3in Biodegradable Polybutylene Succinate: Characterization of the Infiltration Mechanism 3
Experimental determination of the band offset of rare earth oxides on various semiconductors 2
Al2O3 Dot and Antidot Array Synthesis in Hexagonally Packed Poly(styrene-block-methyl methacrylate) Nanometer-Thick Films for Nanostructure Fabrication 2
Thermodynamic stability of high phosphorus concentration in silicon nanostructures 2
Fabrication of GeO2 layers using a divalent Ge precursor 2
Al2O3 passivation on c-Si surfaces for low temperature solar cell applications 2
Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO2 matrix studied by atom probe tomography 2
Atomic oxygen-assisted molecular beam deposition of Gd2O3 films for ultra-scaled Ge-based electronic devices 2
Enhanced Lateral Ordering in Cylinder Forming PS-b-PMMA Block Copolymers Exploiting the Entrapped Solvent 2
Modeling of phosphorus diffusion in silicon oxide and incorporation in silicon nanocrystals 2
Control of Doping Level in Semiconductors via Self-Limited Grafting of Phosphorus End-Terminated Polymers 2
Chemical and Structural Properties of a TaN/HfO2 Gate Stack Processed Using Atomic Vapor Deposition 1
Characterization of gate oxynitrides by means of time of flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy. Quantification of nitrogen 1
Electronic band structures of undoped and P-doped Si nanocrystals embedded in SiO2 1
Detection and characterization of silicon nanocrystals embedded in thin oxide layers 1
Development and Synchrotron-Based Characterization of Al and Cr Nanostructures as Potential Calibration Samples for 3D Analytical Techniques 1
Thickness and Microdomain Orientation of Asymmetric PS-b-PMMA Block Copolymer Films Inside Periodic Gratings. 1
Comparative study of negative cluster emission in sputtering of Si, Ge and their oxides 1
Conduction band offset of HfO2 on GaAs 1
Oxidation-enhanced diffusion of boron in very low-energy N2+ -implanted silicon 1
Characterization of ultra-thin polymeric films by Gas chromatography-Mass spectrometry hyphenated to thermogravimetry 1
The energy band alignment of Si nanocrystals in SiO(2) 1
Behavior of phosphorous and contaminants from molecular doping combined with a conventional spike annealing method 1
Bottom-Up Assembly of Micro/Nanostructures 1
Effect of the Density of Reactive Sites in P(S-r-MMA) Film during Al2O3 Growth by Sequential Infiltration Synthesis 1
Atomic layer deposition of magnetic thin films 1
Energy band alignment at TiO2/Si interface with various interlayers 1
Characterization of silicon nanocrystals embedded in thin oxide layers by TOF-SIMS 1
Periodic Arrays of Dopants in Silicon by Ultralow Energy Implantation of Phosphorus Ions through a Block Copolymer Thin Film 1
Engineering of the spin on dopant process on silicon on insulator substrate 1
Electronic properties at the oxide interface with silicon and germanium through x-ray induced oxide charging 1
Synthesis and characterization of P delta-layer in SiO2 by monolayer doping 1
Totale 52
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Categoria #
all - tutte 1.400
article - articoli 1.266
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 12
Totale 2.678
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2023/202449 0 0 0 0 0 0 0 0 10 0 36 3
2024/20253 3 0 0 0 0 0 0 0 0 0 0 0
Totale 52