CNR Institutional Research Information System

LA VIA, FRANCESCO

LA VIA, FRANCESCO  

Istituto per la Microelettronica e Microsistemi - IMM  

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Risultati 1 - 20 di 370 (tempo di esecuzione: 0.051 secondi).
Titolo Data di pubblicazione Autore(i) File
Operation of a 250μm-thick SiC detector with DT neutrons at high temperatures 1-gen-2024 Kushoro, M. H.; Angelone, M.; Bozzi, D.; Cancelli, S.; Dal Molin, A.; Gallo, E.; Gorini, G.; La Via, F.; Parisi, M.; Perelli Cippo, E.; Putignano, O.; Tardocchi, M.; Rebai, M.
Partially depleted operation of 250 μm-thick silicon carbide neutron detectors 1-gen-2024 Kushoro, M. H.; Angelone, M.; Bozzi, D.; Gorini, G.; La Via, F.; Perelli Cippo, E.; Pillon, M.; Tardocchi, M.; Rebai, M.
Laser crystallization of amorphous TiO2 on polymer 1-gen-2023 Zimbone, Massimo; Cantarella, Maria; Giuffrida, Federico; LA VIA, Francesco; Privitera, Vittorio; Napolitani, Enrico; Impellizzeri, Giuliana
Electrical passivation of stacking-fault crystalline defects in MOS capacitors on cubic silicon carbide (3C-SiC) by post-deposition annealing 1-gen-2022 Fiorenza, P; Maiolo, L; Fortunato, G; Zielinski, M; La Via, F; Giannazzo, F; Roccaforte, F
Multiscale Simulations for Defect-Controlled Processing of Group IV Materials 1-gen-2022 Calogero, G.; Deretzis, I.; Fisicaro, G.; Kollmuss, M.; La Via, F.; Lombardo, S. F.; Scholer, M.; Wellmann, P. J.; La Magna, A.
"Si(n)Ce You Are a Driver": A PCTO Experience about Semiconductor Physic in Italy 1-gen-2021 Canino, Mariaconcetta; Vivani, Laura; LA VIA, Francesco
Detector Response to D-D Neutrons and Stability Measurements with 4H Silicon Carbide Detectors 1-gen-2021 Kushoro, Matteo Hakeem; Rebai, Marica; Tardocchi, Marco; Altana, Carmen; Cazzaniga, Carlo; De Marchi, Eliana; La Via, Francesco; Meda, Laura; Meli, Alessandro; Parisi, Miriam; Perelli Cippo, Enrico; Pillon, Mario; Trotta, Antonio; Tudisco, Salvo; Gorini, Giuseppe
Epitaxial Growth and Characterization of 4H-SiC for Neutron Detection Applications 1-gen-2021 Meli, Alessandro; Muoio, Annamaria; Trotta, Antonio; Meda, Laura; Parisi, Miriam; La Via, Francesco
Silicon Carbide and MRI: Towards Developing a MRI Safe Neural Interface 1-gen-2021 Beygi, Mohammad; DominguezViqueira, William; Feng, Chenyin; Mumcu, Gokhan; Frewin, Christopher L.; La Via, Francesco; Saddow, Stephen E.
Characterization of 4H-and 6H-Like Stacking Faults in Cross Section of 3C-SiC Epitaxial Layer by Room-Temperature mu-Photoluminescence and mu-Raman Analysis 1-gen-2020 Scuderi, Viviana; Calabretta, Cristiano; Anzalone, Ruggero; Mauceri, Marco; La Via, Francesco
Generation and Termination of Stacking Faults by Inverted Domain Boundaries in 3C-SiC 1-gen-2020 Zimbone, Massimo; Barbagiovanni Eric, Gasparo; Bongiorno, Corrado; Calabretta, Cristiano; Calcagno, Lucia; Fisicaro, Giuseppe; LA MAGNA, Antonino; LA VIA, Francesco
Genesis and evolution of extended defects: The role of evolving interface instabilities in cubic SiC 1-gen-2020 Giuseppe Fisicaro ; Corrado Bongiorno ; Ioannis Deretzis ; Filippo Giannazzo ; Francesco La Via ; Fabrizio Roccaforte ; Marcin Zielinski ; Massimo Zimbone ; Antonino La Magna
Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy 1-gen-2020 Filippo Giannazzo ; Giuseppe Greco ; Salvatore Di Franco ; Patrick Fiorenza ; Ioannis Deretzis ; Antonino La Magna ; Corrado Bongiorno ; Massimo Zimbone ; Francesco La Via ; Marcin Zielinski ; Fabrizio Roccaforte
Ni/4H-SiC interaction and silicide formation under excimer laser annealing for ohmic contact 1-gen-2020 Badala, Paolo; Rascuna, Simone; Cafra, Brunella; Bassi, Anna; Smecca, Emanuele; Zimbone, Massimo; Bongiorno, Corrado; Calabretta, Cristiano; La Via, Francesco; Roccaforte, Fabrizio; Saggio, Mario; Franco, Giovanni; Messina, Angelo; La Magna, Antonino; Alberti, Alessandra
On the origin of the premature breakdown of thermal oxide on 3C-SiC probed by electrical scanning probe microscopy 1-gen-2020 Fiorenza, P; Schiliro, E; Giannazzo, F; Bongiorno, C; Zielinski, M; La Via, F; Roccaforte, F
Silicon Carbide characterization at the n_TOF spallation source with quasi-monoenergetic fast neutrons 1-gen-2020 Kushoro, M H; Rebai, M; Dicorato, M; Rigamonti, D; Altana, C; Cazzaniga, C; Croci, G; Gorini, G; Lanzalone, G; La Via, F; Muoio, A; Muraro, A; Murtas, F; Cippo, E Perelli; Tardocchi, M; Barbagallo, M; Mingrone, F; Tudisco, S
Silicon Carbide devices for radiation detection and measurements 1-gen-2020 La Via F.; Tudisco S.; Altana C.; Boscardin M.; Ciampi C.; Cirrone G.A.P.; Fazzi A.; Giove D.; Gorini G.; Lanzalone G.; Muoio A.; Pasquali G.; Petringa G.; Puglia S.M.R.; Rebai M.; Santangelo A.; Trifiro A.
3C-SiC grown on Si by using a Si1-xGex buffer layer 1-gen-2019 Zimbone, M; Zielinski, M; Barbagiovanni, E G; Calabretta, C; La Via, F
3C-SiC Growth on Inverted Silicon Pyramids Patterned Substrate 1-gen-2019 Zimbone, Massimo; Zielinski, Marcin; Bongiorno, Corrado; Calabretta, Cristiano; Anzalone, Ruggero; Scalese, Silvia; Fisicaro, Giuseppe; LA MAGNA, Antonino; Mancarella, Fulvio; LA VIA, Francesco
Biocompatibility between Silicon or Silicon Carbide surface and Neural Stem Cells 1-gen-2019 Bonaventura, Gabriele; Iemmolo, Rosario; LA COGNATA, Valentina; Zimbone, Massimo; La Via, Francesco; Elena Fragalà, Maria; Luisa Barcellona, Maria; Pellitteri, Rosalia; Cavallaro, Sebastiano