PARISINI, ANDREA
 Distribuzione geografica
Continente #
AS - Asia 1.447
NA - Nord America 708
EU - Europa 280
SA - Sud America 254
AF - Africa 24
OC - Oceania 1
Totale 2.714
Nazione #
US - Stati Uniti d'America 669
SG - Singapore 624
CN - Cina 394
BR - Brasile 204
HK - Hong Kong 140
VN - Vietnam 132
FR - Francia 91
KR - Corea 53
NL - Olanda 51
IT - Italia 35
DE - Germania 24
AR - Argentina 21
GB - Regno Unito 20
IN - India 20
CA - Canada 19
JP - Giappone 19
FI - Finlandia 15
MX - Messico 13
ZA - Sudafrica 10
IL - Israele 9
BD - Bangladesh 8
ID - Indonesia 8
EC - Ecuador 7
PK - Pakistan 7
ES - Italia 6
PL - Polonia 6
CO - Colombia 5
IQ - Iraq 5
SA - Arabia Saudita 5
UA - Ucraina 5
BE - Belgio 4
PE - Perù 4
PY - Paraguay 4
RU - Federazione Russa 4
SE - Svezia 4
CH - Svizzera 3
CL - Cile 3
EG - Egitto 3
PH - Filippine 3
TR - Turchia 3
UY - Uruguay 3
AE - Emirati Arabi Uniti 2
AT - Austria 2
BO - Bolivia 2
CR - Costa Rica 2
GR - Grecia 2
JM - Giamaica 2
JO - Giordania 2
LA - Repubblica Popolare Democratica del Laos 2
LK - Sri Lanka 2
LV - Lettonia 2
MY - Malesia 2
NP - Nepal 2
TN - Tunisia 2
UZ - Uzbekistan 2
BA - Bosnia-Erzegovina 1
BJ - Benin 1
BS - Bahamas 1
BW - Botswana 1
CG - Congo 1
DJ - Gibuti 1
DK - Danimarca 1
DO - Repubblica Dominicana 1
DZ - Algeria 1
KE - Kenya 1
KG - Kirghizistan 1
LT - Lituania 1
MA - Marocco 1
MD - Moldavia 1
MN - Mongolia 1
NA - Namibia 1
NG - Nigeria 1
NO - Norvegia 1
NZ - Nuova Zelanda 1
OM - Oman 1
PT - Portogallo 1
TT - Trinidad e Tobago 1
VE - Venezuela 1
Totale 2.714
Città #
Singapore 373
Santa Clara 299
Hong Kong 138
Hefei 123
Beijing 99
San Jose 70
Lauterbourg 65
Seoul 53
Ashburn 39
Ho Chi Minh City 39
Hanoi 38
Los Angeles 36
Guangzhou 19
New York 19
Buffalo 12
São Paulo 12
Helsinki 10
Tokyo 10
Frankfurt am Main 9
Montreal 9
Dallas 8
Bologna 7
Curitiba 7
Da Nang 7
Minamishinagawa 7
Belo Horizonte 6
Johannesburg 6
Orem 6
Bengaluru 5
Brasília 5
Haiphong 5
Munich 5
Rio de Janeiro 5
Brussels 4
Carlazzo 4
Lahore 4
London 4
Philadelphia 4
Roubaix 4
São João de Meriti 4
Turku 4
Atlanta 3
Buenos Aires 3
Cairo 3
Can Tho 3
Denver 3
Falkenstein 3
Goiânia 3
Itaquaquecetuba 3
Mexico City 3
Mumbai 3
Ninh Bình 3
Phủ Lý 3
Rome 3
Salvador 3
Stockholm 3
Uberlândia 3
Wroclaw 3
Amman 2
Aryanah 2
Asunción 2
Balsas 2
Biên Hòa 2
Brooklyn 2
Bình An 2
Bình Dương 2
Cabo Frio 2
Campinas 2
Caratinga 2
Caruaru 2
Chengdu 2
Chennai 2
Chicago 2
Colombo 2
Dourados 2
Elk Grove Village 2
Erice 2
Fortaleza 2
Guayaquil 2
Houston 2
Hünenberg 2
Hải Dương 2
Ipatinga 2
Jaraguá do Sul 2
Joinville 2
Kingston 2
La Paz 2
La Spezia 2
Lima 2
Mauá 2
Medellín 2
Medina 2
Milan 2
Montevideo 2
Natal 2
Nha Trang 2
Nova Iguaçu 2
Nuremberg 2
Osasco 2
Paris 2
Totale 1.718
Nome #
There's light in the shadow! The Poisson-Arago experiment. 113
On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt-Si and its effect on the electrical properties 75
Oxidation kinetics of ion-amorphized (0001) 6H-SiC: Competition between oxidation and recrystallization processes 67
Advanced microsensor technology using porous silicon layers permeated with Sn-V mixed oxides 60
Diffusion and activation of ultrashallow B implants in silicon on insulator: End-of-range defect dissolution and the buried Si/SiO2 interface 54
ZnSe/CdTe/ZnSe heterostructures 54
Activation of porous silicon layers using Zn2SiO4 : Mn2+ phosphor particles 54
Engineering interfacial structure in "Giant" PbS/CdS quantum dots for photoelectrochemical solar energy conversion 54
Monte Carlo Simulation of Elastic and Inelastic Scattering of Electrons in Thin Films:1. Valence Electron losses 47
Size effect on high temperature variable range hopping in Al+ implanted 4H-SiC 47
Real time investigation of the growth of silicon carbide nanocrystals on Si (100) using synchroton X-ray diffraction 46
Competition between oxidation and recrystallization in ion amorphized (0001) 6H-SIC 44
Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si 44
High resolution medium energy ion scattering analysis for the quantitative depth profiling of ultrathin high-k layers 44
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films 43
Si Ultra Shallow Junctions Dopant Profiling with ADF-STEM 42
4H-SiC ion implanted bipolar junctions: Relevance of the 1950°C temperature for post implantation annealing 42
Metodologie di crescita di nanotubi di carbonio mediante deposizione chimica da fase vapore su substrati patternati e in nanostampi 41
Comment on luminescent nanoring structures on silicon 41
Dopant profiling on ultrashallow junctions in Si with ADF-STEM 41
Carbon Nanotubes: Synthesis and Applications 41
Electrical and structural properties of ultrathin SiON films on Si prepared by plasma nitridation 41
Structural characterization of alloyed Al/Ti and Ti contacts on SiC 40
Dual emission in asymmetric "giant" PbS/CdS/CdS core/shell/shell quantum dots 40
On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt-Si and its effect on the electrical properties 40
Carbon nanotubes grown by catalytic CVD on silicon based substrates for electronics applications 39
Charge trapping properties and charge retention-time in amorphous SiGe/SiO2 nanolayers 39
IBA study of SiGe/SiO2 nanostructured multilayers 38
Thick porous Silicon Thermo-Insulating Membranes 38
Silicon carbide nanocrystals growth on Si(100) and Si(111) from a chemisorbed methanol layer 38
Quantitative determination of the dopant distribution in Si ultrashallow junctions by tilted sample annular dark field scanning transmission electron microscopy 38
Cap removal and shortening of double-walled and very-thin multi-walled carbon nanotubes under mild oxidative conditions 38
Carbon Nanotubes Grown by Catalytic CVD on Silicon Based Substrates for Electronics Applications 37
SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO2 multilayers 37
Structural and functional characterizations of Al+ implanted 4H-SiC layers and Al+ implanted 4H-SiC p-n junctions after 1950°C post implantation annealing 37
Permeated porous silicon for hydrocarbon sensor fabrication 36
Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlattice 36
Excitonic properties and band alignment in lattice-matched ZnCdSe/ZnMgSe multiple-quantum-well structures 35
A Luminescent Host-Guest Hybrid between an EuIII Complex and MWCNTs 34
High temperature variable range hopping in heavy Al implanted 4H-SiC 34
Cap removal and shortening of double-walled and very-thin multi-walled carbon nanotubes under mild oxidative conditions 33
Investigation on carbon nanotube growth by site selective CVD with nickel catalyst 32
TEM characterisation of porous silicon 31
Thickness and orientation dependence of the average HAADF STEM normalized intensity: a comparison with Monte Carlo and Multislice simulations. 31
Structural and analytical characterization by scanning transmission electron microscopy of silicon-based nanostructures 31
Comment on 29
Bragg-Case X-ray interference in multilayered structures. Comparison between kinematical approximation and dynamical treatment 29
Si Ultra Shallow Junctions Dopant Profiling with ADF-STEM 29
Sensitivity and selectivity enhancement in WO3 and Cr2-xTixO3 thin films deposited by pulsed laser ablation 29
Influence of the electrolyte viscosity on the structural features of porous silicon 28
Boron deactivation in preamorphized silicon on insulator: Efficiency of buried oxide as an interstitial sink 28
Structural and electronic properties of ZnSe/AlAs heterostructures 28
HREM, la via coerente alla risoluzione atomica 28
Structural and optical properties of oxidized porous silicon layers activated by Zn2SiO4 : Mn2+ 28
Comparison of Electrical Measurements with Structural Analysis of Thin High-k Hf-Based Dielectric Films on Si 28
High Resolution Depth Profile Analysis of Ultra Thin High-º Hf Based Films Using MEIS Compared with XTEM, XRF, SE and XPS 27
Damage profiles in high-energy As implanted Si 27
Arsenic uphill diffusion during shallow junction formation 26
Structural characterization of alloyed Al/Ti and Ti contacts on SiC 26
Thickness effects in tilted sample annular dark field scanning transmission electron microscopy 25
Influence of electron-beam parameters on the radiation-induced formation of graphitic onions 25
Luminescent single-walled carbon nanotubes 24
THICKNESS EFFECTS IN TILTED SAMPLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY 24
Wet absorption of a Eu(III)-complex on Carbon Nanotubes Sidewwalls 24
Structural characterization of Ar+-ion-amorphized 6H-SiC wafers annealed at 1100 degrees C in N-2 or wet O-2 ambient 23
Porous silicon layer permeated with Sn-V mixed oxides for hydrocarbon sensor fabrication 22
Behaviour of low energy As ions implanted in Si through a thin oxide layer 21
Structural characterization of Ar+-ion-amorphized 6H-SiC wafers annealed at 1100 °C in N2 or wet O-2 ambient 21
Low-temperature thermal oxidation of ion-amorphized 6H-SiC 21
Wet Adsorption of a Luminescent Eu(III) complex on Carbon Nanotubes Sidewalls 20
Structural characterisation of alloyed Al/Ti and Ti contacts on SiC 20
Investigation on indium diffusion in silicon 19
Structural characterization and modeling of damage accumulation in In implanted Si 19
Competition between Oxidation and Recrystallization in Ion Amorphized (0001) 6H-SiC 18
La micromeccanica del silicio 18
Competition between oxidation and recrystallization in ion amorphized (0001) 6H-SIC 16
Totale 2.717
Categoria #
all - tutte 9.314
article - articoli 7.085
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 81
Totale 16.480


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2023/202430 0 0 0 0 0 0 0 0 3 0 27 0
2024/20251.125 0 7 74 48 259 50 4 65 18 60 310 230
2025/20261.562 90 150 142 241 356 63 229 88 67 86 39 11
Totale 2.717