TALLARIDA, GRAZIELLA
 Distribuzione geografica
Continente #
AS - Asia 1.645
NA - Nord America 1.127
SA - Sud America 350
EU - Europa 316
Continente sconosciuto - Info sul continente non disponibili 55
AF - Africa 23
OC - Oceania 3
Totale 3.519
Nazione #
US - Stati Uniti d'America 1.075
SG - Singapore 714
CN - Cina 362
BR - Brasile 286
HK - Hong Kong 187
VN - Vietnam 147
FR - Francia 94
IT - Italia 83
KR - Corea 74
NL - Olanda 35
BD - Bangladesh 32
JP - Giappone 31
IN - India 23
CA - Canada 21
DE - Germania 20
CO - Colombia 17
FI - Finlandia 15
GB - Regno Unito 15
MX - Messico 15
AR - Argentina 14
EC - Ecuador 14
ID - Indonesia 13
RU - Federazione Russa 11
TR - Turchia 8
PL - Polonia 7
SA - Arabia Saudita 7
UA - Ucraina 7
VE - Venezuela 7
IL - Israele 6
UZ - Uzbekistan 6
EG - Egitto 5
JM - Giamaica 5
MA - Marocco 5
ZA - Sudafrica 5
CR - Costa Rica 4
ES - Italia 4
GR - Grecia 4
IE - Irlanda 4
PH - Filippine 4
SE - Svezia 4
CL - Cile 3
CZ - Repubblica Ceca 3
IQ - Iraq 3
JO - Giordania 3
OM - Oman 3
PK - Pakistan 3
UY - Uruguay 3
AE - Emirati Arabi Uniti 2
AL - Albania 2
AU - Australia 2
BO - Bolivia 2
KZ - Kazakistan 2
LT - Lituania 2
MT - Malta 2
MY - Malesia 2
PE - Perù 2
PY - Paraguay 2
SC - Seychelles 2
TT - Trinidad e Tobago 2
TW - Taiwan 2
AM - Armenia 1
BE - Belgio 1
BG - Bulgaria 1
BH - Bahrain 1
BW - Botswana 1
CM - Camerun 1
CW - ???statistics.table.value.countryCode.CW??? 1
DO - Repubblica Dominicana 1
DZ - Algeria 1
GT - Guatemala 1
HN - Honduras 1
IR - Iran 1
KH - Cambogia 1
KW - Kuwait 1
LA - Repubblica Popolare Democratica del Laos 1
MM - Myanmar 1
MN - Mongolia 1
NE - Niger 1
NG - Nigeria 1
NI - Nicaragua 1
NP - Nepal 1
NZ - Nuova Zelanda 1
PA - Panama 1
PS - Palestinian Territory 1
PT - Portogallo 1
SK - Slovacchia (Repubblica Slovacca) 1
SO - Somalia 1
TH - Thailandia 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 3.466
Città #
Singapore 439
Santa Clara 396
Hong Kong 182
Hefei 139
Ashburn 92
Lauterbourg 84
San Jose 84
Seoul 73
Beijing 63
Ho Chi Minh City 58
Hanoi 32
São Paulo 30
Guangzhou 22
Rome 22
Tokyo 19
New York 17
Los Angeles 15
Brasília 13
Dallas 11
Rio de Janeiro 10
Buffalo 9
Frankfurt am Main 9
Bologna 8
Minamishinagawa 8
Orem 8
Chicago 7
Da Nang 7
Haiphong 7
Milan 7
Bogotá 6
Brooklyn 6
Helsinki 6
Quito 6
Baltimore 5
Belo Horizonte 5
Cairo 5
Dhaka 5
Ha Long 5
Lappeenranta 5
Philadelphia 5
Piscataway 5
Porto Alegre 5
Queens 5
Tashkent 5
Chennai 4
Denver 4
Dublin 4
Guastalla 4
Houston 4
Kingston 4
Memphis 4
Newark 4
Nuremberg 4
Oakland 4
Phoenix 4
Potenza 4
San Francisco 4
San José 4
Turku 4
Amman 3
Ankara 3
Atlanta 3
Baghdad 3
Bengaluru 3
Biên Hòa 3
Caracas 3
Carapicuíba 3
Changsha 3
Cincinnati 3
Columbus 3
Cordova 3
Council Bluffs 3
Greater Sudbury 3
Guayaquil 3
Hangzhou 3
Hải Dương 3
Manaus 3
Medina 3
Montreal 3
Moscow 3
Naples 3
Norfolk 3
Recife 3
Ribeirão Preto 3
Richmond 3
San Diego 3
Santo André 3
Santos 3
Seattle 3
Silver Spring 3
Thái Bình 3
Alatri 2
Athens 2
Bedford 2
Betim 2
Blumenau 2
Bắc Giang 2
Campinas 2
Can Tho 2
Cape Town 2
Totale 2.124
Nome #
Plasma-Assisted Atomic Layer Deposition of IrO2 for Neuroelectronics 94
Al2O3 Dot and Antidot Array Synthesis in Hexagonally Packed Poly(styrene-block-methyl methacrylate) Nanometer-Thick Films for Nanostructure Fabrication 81
Surface segregation mechanisms in dielectric thin films 75
Simulation of micro-mirrors for optical MEMS 73
Ferromagnetic resonance of Co thin films grown by atomic layer deposition on the Sb2Te3 topological insulator 70
ALD growth of ultra-thin Co layers on the topological insulator Sb2Te3 68
Engineering Domain-Wall Motion in Co-Fe-B/MgO Ultrathin Films with Perpendicular Anisotropy Using Patterned Substrates with Subnanometer Step Modulation 59
Extraction of Defects Properties in Dielectric Materials From I-V Curve Hysteresis 59
Periodic Arrays of Dopants in Silicon by Ultralow Energy Implantation of Phosphorus Ions through a Block Copolymer Thin Film 59
Atomic Defects Profiling and Reliability of Amorphous Al2O3Metal-Insulator-Metal Stacks 57
MDM-ST-2005-D15-Investigation of copper barrier efficiency with selected low-k dielectrics. 55
Nanoscale morphological and electrical homogeneity of HfO2 and ZrO2 thin films studied by conducting atomic-force microscopy 55
Advanced protective coatings for reflectivity enhancement by low temperature atomic layer deposition of HfO2 on Al surfaces for micromirror applications 55
Effect of Electric Dipoles on Fermi Level Positioning at the Interface between Ultrathin Al2O3 Films and Differently Reconstructed In0.53Ga0.47As(001) Surfaces 54
Structural and electrical properties of HfO2 films grown by atomic layer deposition on Si, Ge, GaAs and GaN 54
A comparison of Ti/Pt and TiN/Pt electrodes used with ferroelectric SrBi2Ta2O9 films 52
The electrons' journey in thick metal oxides 49
Perpendicular magnetic anisotropy in Ta/CoFeB/MgO systems synthesized on treated SiN/SiO2 substrates for magnetic memories 46
MDM-ST-2004-D1-Growth of Hf aluminated produced by Atomic Layer Deposition using alternative precursors 44
Synthesis of magnetic tunnel junctions with full in situ atomic layer and chemical vapor deposition processes 43
Formation and disruption of conductive filaments in a HfO2/TiN structure 43
Excited-State Lifetime Assay for Protein Detection on Gold Colloids-Fluorophore Complexes 43
Effects of the oxygen precursor on the electrical and structural propertiesof HfO2 films grown by atomic layer deposition on Ge 42
2-D Finite-Element Modeling of ZnO Schottky Diodes With Large Ideality Factors 42
Transport characterization of silicon-YBCO buffered multilayers deposited by magnetron sputtering 41
Solid-state dewetting of ultra-thin Au films on SiO2and HfO2 41
Atomic layer deposition of Lu silicate films using [(Me3Si)(2)N](3)Lu 40
Low-temperature atomic layer deposition of MgO thin films on Si 40
Low-temperature atomic layer deposition of MgO thin films on Si 40
A comparison of hot-hole induced degradation in thin-film transistors using thermally recrystallised and LPCVD deposited polycrystalline silicon as active layer 38
Local Electronic Properties of Corrugated Silicene Phases 38
Intrinsic pinning and current percolation signatures in E-J characteristics of Si/YSZ/CeO2/YBCO layouts 38
Annealing effects on silicon-rich thin film oxides studied by spectroscopic ellipsometry 37
Bipolar resistive switching of Au/NiOx/Ni/Au heterostructure nanowires 37
Voltage regulation of fluorescence emission of single dyes bound to gold nanoparticles 37
Engineered fabrication of ordered arrays of Au-NiO-Au nanowires 37
Vertically stacked non-volatile memory devices - material considerations 37
Structural and electrical properties of HfO2 films grown by atomic layer deposition on Si, Ge, GaAs and GaN 36
The influence of low temperature baking on the properties of SrBi2Ta2O9 films from metallorganic solutions 34
Resistance switching in amorphous and crystalline binary oxides grown by electron beam evaporation and atomic layer deposition 33
Nitridation by NO or N2O of Si-SiO2 interfaces 33
Cubic-to-monoclinic phase transition during the epitaxial growth of crystalline Gd2O3 films on Ge(001) substrates 33
Trends of structural and electrical properties in atomic layer deposited HfO2 films 32
Atomic oxygen-assisted molecular beam deposition of Gd2O3 films for ultra-scaled Ge-based electronic devices 32
Low-power resistive switching in Au/NiO/Au nanowire arrays 32
Effects of annealing temperature and surface preparation on the formation of cobalt silicide interconnects 31
Influence of roughness and grain dimension on the optical functions of polycrystalline silicon films 30
Integration of organic based Schottky junctions into crossbar arrays by standard UV lithography 30
ZnO grown by atomic layer deposition: A material for transparent electronics and organic heterojunctions 29
Optical and electrical characterization of defects in zinc oxide thin films grown by atomic layer deposition 29
Characterization of Si-CeO2-YBCO Tri-layers Grown by Magnetron Sputtering 29
ANALYSIS OF HOT-CARRIER-INDUCED DEGRADATION IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS 29
MDM-ST-2006-D14-Investigation of copper barrier efficiency with selected low-k dielectrics. 28
ZnO based selectors for crosspoint memory devices 28
CeO2 thin films as buffer layers for Si/YBCO integrated microelectronics 28
Structural and electrical characterization of ALCVD ZrO2 thin films on silicon 28
Off-current in polycrystalline thin film transistors: an analysis of the thermally generated component 27
New selector based on zinc oxide grown by low temperature atomic layer deposition for vertically stacked non-volatile memory devices 27
MDM-ST-2003-IR5- 27
CVD synthesis of polycrystalline magnetite thin films: structural, magnetic and magnetotransport properties 27
Atomic-layer deposition of Lu2O3 27
MDM-ST-2005-D16-Evaluation of barrier stacks alternative to PVD TaNTa. 27
Integration of organic based Schottky junctions for crossbar non-volatile memory applications 27
ZnO based selectors for crossbar non-volatile memories 27
Leakage current reduction due to hot carrier effects in n-channel polycrystalline thin film transistors 27
Thermal and field-induced generation mechanisms in polysilicon thin film transistors: A comparison between n-channel and p-channel devices 26
Numerical analysis of poly-TFTs under off conditions 26
ESQUI-2002-D9-Cobalt and cobalt silicides samples: preparation and qualification 26
Anomalous off-current mechanisms in n-channel poly-Si thin film transistors 26
Scanning capacitance force microscopy and Kelvin probe force microscopy of nanostructures embedded in SiO2 25
Low temperature rectifying junctions for crossbar non-volatile memory devices 25
Formation and stability of germanium oxide induced by atomic oxygen exposure 25
Al2O3 as gate dielectric for organic transistors: Charge transport phenomena in poly-(3-hexylthiophene) based devices 25
High fields effects in polysilicon thin film transistors 25
MDM-ST-2004-D19-Characterisation of nickel silicide 25
In situ chemical and structural investigations of the oxidation of Ge(001) substrates by atomic oxygen 25
MDM-ST-2005-D16-II-Thermal stability of PVD-TaNTa/Cu system with reduced Cu-seed layers 24
Self-annealing and aging effect characterization on copper seed thin films 24
MDM-ST-2002-IR5-Self-aligned silicides for 130 nm flash memories: impact of the surface cleaning before cobalt deposition on the formation of silicides 24
Resistive switching in NiO based nanowire array for low power RERAM 23
The effects of baking cycles on the properties of ferroelectric thin films 23
Hot hole-induced degradation in polycrystalline silicon thin film transistors: experimental and theoretical analysis 23
MDM-ST-2006-D13-Evaluation of barrier stacks alternative to PVD TaNTa. 23
Hot carrier effects in n-channel polycrystalline silicon thin film transistors: a correlation between off- current and transconductance variations 23
On the correlation between surface roughness and inversion layer mobility in Si-MOSFETs 22
Hot-hole induced degradation in polycrystalline silicon TFTs: experimental and theoretical analysis 22
Effects of growth temperature on the properties of atomic layer deposition grown ZrO2 films 22
Characterization of silicon-YBCO buffered multilayers grown by sputtering 22
Microstructures of sputtered oriented Si/CeO2 bi-layers for YBa2Cu3O7-d/Si integrated microelectronics 22
MDM-ST-2005-D17-Structural and chemical stability of the Si3N4 /Cu interface 21
The interface between Gd2O3 films and Ge(001): A comparative study between molecular and atomic oxygen mediated growths 20
MDM-ST-2004-D13-Thermal stability of the Ta(N)Ta barrier stack in the dielectric/barrier/copper system 20
Segregation in Dielectric Thin Films 20
Surface segregation mechanisms in ferroelectric thin films 20
Thermal conductivity of SiO2 films by scanning thermal microscopy 18
Erbium-doped crystalline YAG planar and ridge waveguides on quartz and sapphire substrates: deposition and material characterisation 18
Epitaxial growth of cubic Gd(2)O(3) thin films on Ge substrates 18
Surface morphology of nitrided thin thermal SiO(2) studied by atomic force microscopy 17
Poly(3-hexylthiophene)/ZnO hybrid pn junctions for microelectronics applications 17
Characterisation of nanocrystals by scanning capacitance force microscopy 17
Totale 3.482
Categoria #
all - tutte 13.761
article - articoli 10.559
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 24.320


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2023/202446 0 0 0 0 0 0 0 0 7 6 32 1
2024/20251.336 3 5 108 48 296 116 32 58 20 48 331 271
2025/20261.747 88 160 217 293 310 67 257 100 78 95 50 32
2026/2027390 88 110 192 0 0 0 0 0 0 0 0 0
Totale 3.519