CNR Institutional Research Information System

ARMIGLIATO, ALDO
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
AS - Asia 1.036
NA - Nord America 429
SA - Sud America 207
EU - Europa 173
AF - Africa 15
OC - Oceania 1
Totale 1.861
Salva come PNG Salva come JPEG
Nazione #
SG - Singapore 464
US - Stati Uniti d'America 410
CN - Cina 243
BR - Brasile 162
VN - Vietnam 117
HK - Hong Kong 105
NL - Olanda 77
KR - Corea 52
AR - Argentina 22
IT - Italia 21
FR - Francia 17
FI - Finlandia 14
ID - Indonesia 12
MX - Messico 10
EC - Ecuador 9
GB - Regno Unito 9
IN - India 8
JP - Giappone 8
IL - Israele 6
PL - Polonia 6
ZA - Sudafrica 6
BD - Bangladesh 5
CA - Canada 5
DE - Germania 5
ES - Italia 5
PY - Paraguay 4
RU - Federazione Russa 4
TR - Turchia 4
UA - Ucraina 4
VE - Venezuela 4
CO - Colombia 3
SE - Svezia 3
DZ - Algeria 2
HN - Honduras 2
LB - Libano 2
MA - Marocco 2
PE - Perù 2
UZ - Uzbekistan 2
AO - Angola 1
AT - Austria 1
BH - Bahrain 1
BY - Bielorussia 1
CL - Cile 1
CR - Costa Rica 1
EG - Egitto 1
HR - Croazia 1
IE - Irlanda 1
JO - Giordania 1
LA - Repubblica Popolare Democratica del Laos 1
LT - Lituania 1
MD - Moldavia 1
MZ - Mozambico 1
NP - Nepal 1
NZ - Nuova Zelanda 1
OM - Oman 1
PH - Filippine 1
RS - Serbia 1
RW - Ruanda 1
SA - Arabia Saudita 1
SK - Slovacchia (Repubblica Slovacca) 1
TG - Togo 1
TT - Trinidad e Tobago 1
TW - Taiwan 1
Totale 1.861
Salva come PNG Salva come JPEG
Città #
Singapore 270
Santa Clara 256
Hong Kong 104
Hefei 101
Beijing 81
Seoul 49
Ho Chi Minh City 42
Ashburn 21
San Jose 19
Hanoi 14
Los Angeles 13
Helsinki 11
São Paulo 9
Buffalo 7
Dallas 7
Milan 7
Minamishinagawa 7
Porto Alegre 7
Rio de Janeiro 7
Haiphong 5
Americana 4
Buenos Aires 4
Da Nang 4
Hải Dương 4
New York 4
Phoenix 4
Wroclaw 4
Bắc Giang 3
Chennai 3
Guangzhou 3
Guayaquil 3
Marseille 3
Ninh Bình 3
Orem 3
Quito 3
Roubaix 3
Salvador 3
Thái Nguyên 3
Turku 3
Asunción 2
Atlanta 2
Bandung 2
Belo Horizonte 2
Bengaluru 2
Bexley 2
Biên Hòa 2
Bologna 2
Brasília 2
Can Tho 2
Chicago 2
Contagem 2
Coro 2
Council Bluffs 2
Curitiba 2
Curvelo 2
Cà Mau 2
Durban 2
Fort Worth 2
Frankfurt am Main 2
Gangnam-gu 2
Guarulhos 2
Houston 2
Hà Tĩnh 2
Jakarta 2
Johannesburg 2
Lauterbourg 2
Lecce 2
Lima 2
Limbiate 2
Long An 2
Nova Iguaçu 2
Padua 2
Phủ Lý 2
Poplar 2
Portland 2
Praia Grande 2
Quận Bảy 2
Quận Phú Nhuận 2
Sorocaba 2
Stockholm 2
Sumaré 2
São José dos Campos 2
Tashkent 2
Trieste 2
Vĩnh Long 2
Warsaw 2
Abohar 1
Agadir 1
Ajax 1
Altamira 1
Amman 1
Amsterdam 1
Andresito 1
Ankara 1
Anápolis 1
Aracaju 1
Araras 1
Araruama 1
Araucária 1
Assis 1
Totale 1.209
Salva come PNG Salva come JPEG
Nome #
Boron nitride thin films deposited by RF plasma reactive pulsed laser ablation as interlayer between WC-Co hard metals and CVD diamond films 55
Electron diffraction with ten nanometer beam size for strain analysis of nanodevices 51
Improving spatial resolution of convergent beam electron diffraction strain mapping in silicon microstructures 50
Stress engineering in Si based micro structures using technology computer-aided design 49
Quantitative strain mapping in nanoelectronic silicon devices by convergent beam electron diffraction 44
GROWTH AND STRUCTURE OF TITANIUM SILICIDE PHASES FORMED BY THIN TI FILMS ON SI CRYSTALS 44
Split HOLZ lines analysis as a tool to map the strain field in patterned nanostructure 42
Modern developments and applications in microbeam analysis. Proceedings of the 9(th) Workshop of the European Microbeam Analysis Society (EMAS) and the 3(rd) Meeting of the International Union of Microbeam Analysis Societies (IUMAS), Florence, Italy, May 42
Characterization of the PSG/Si interface of H3PO4 doping process for solar cells 37
Diaframma per microscopio elettronico e procedimento per realizzare tale diaframma 35
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films 35
Structural and analytical characterization of Si1-x Gex /Si heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double crystal X-ray diffractometry 34
Application of the parametric bootstrap method to determine statistical errors in quantitative X-ray microanalysis of thin films 34
X-Ray Microanalysis Combined with Monte Carlo Simulation for the Analysis of Layered Thin Films: The Case of Carbon Contamination 32
Effect of nitrogen implantation at the SiO2/SiC interface on the electron mobility and free carrier density in 4H-SiC metal oxide semiconductor field effect transistor channel 32
Nitridation of the SiO(2)/SiC interface by N(+) implantation: Hall versus field effect mobility in n-channel planar 4H-SiC MOSFETs 32
Damage and recovery in boron doped silicon on insulator layers after high energy Si+ implantation 31
Nitridation of the SiO2/SiC Interface by N+ implantation: Hall versus field effect mobility in n-channel planar 4H-SiC MOSFETs 30
Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles 30
Presentazione orale 29
HOLZ Line Splitting coupled to a Recursive Procedure. A Tool for the Displacement Field Determination in Nanostructures 29
Analytical electron microscopy of Si 1- x Ge x/Si heterostructures and local isolation structures 28
Dislocation generation in device fabrication process 28
Structural and analytical characterization by scanning transmission electron microscopy of silicon-based nanostructures 28
Investigation of strain distribution in LOCOS structures by dynamical simulation of LACBED patterns 27
Convergent beam electron diffraction investigation of strain induced by Ti self-aligned silicides in shallow trench Si isolation structures 27
Strain measurements in thin film structures by convergent beam electron diffraction 27
Thickness and orientation dependence of the average HAADF STEM normalized intensity: a comparison with Monte Carlo and Multislice simulations. 27
FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient 27
DEPTH PROFILES AND DAMAGE ANNEALING OF 1.06-MEV AS-2+ IMPLANTED IN SILICON 26
Nano beam and convergent beam elecron diffraction for strain anaysis in nano-electronics 26
TEM/CBED determination of strain in silicon-based submicrometric electronic devices 26
Lattice strain and static disorder determination in Si/Si_ {1-x} Ge_ {x}/Si heterostructures by convergent beam electron diffraction 25
Quantitative X-ray microanalysis of thin NiO films by Monte Carlo and Cliff-Lorimer methods 25
MIcrochimica Acta: Proceedings of the 9th Workshop of European Microbean analysis Society (EMAS) and the 3rd Meeting og the International Union of Microbean Analysis Societies (IUMAS), Florence, Italy, may 22-26, 2005 25
Strain determination in submicron isolation structures by TEM/CBED 24
Microanalisi a Raggi X e microdiffrazione a fascio convergente: applicazioni al silicio 24
On the strain determination in cross-sectioned heterostructures by TEM/LACBED 22
Strain analysis of deep sub-micron CMOS devices by TEM/CBED in the < 230 > zone axis 22
On the Spatial Resolution in Analytical Electron Microscopy 21
Damage and recovery in boron doped SOI layers after high energy implantation 21
Strain field reconstruction in shallow trench isolation structures by CBED and LACBED 21
Structural and analytical characterization of Si1-xGex heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double X-ray diffractometry 21
Effects of static disorder on LACBED patterns of single crystal silicon implanted with hydrogen 20
Microanalisi a raggi X e microdiffrazione a fascio convergente:applicazioni al Silicio 19
Damage and recovery in doped SOI layers after high energy implantation 19
Dynamical simulation of LACBED patterns in cross-sectioned heterostructures 19
Analysis of localised strains in crystals by convergent beam electron diffraction 19
Strain determination in silicon microstructures by combined convergent beam electron diffraction, process, simulation, and micro-Raman spectroscopy 19
Quantitative thin-film X-ray microanalysis by STEM/HAADF: Statistical analysis for precision and accuracy determination 19
Investigation of Strain in Si1-xGex/Si Heterostructures and Local Isolation Structures by Convergent Beam Electron Diffraction 18
A novel Monte-Carlo based method for quantitative thin film X-ray microanalysis 18
Strain characterisation of shallow trench isolation structures on a nanometer scale by convergent beam electron diffraction 18
Strain analysis in sub-micron silicon devices by TEM/CBED 17
Strain induced by Ti salicidation in sub-quarter-micron CMOS devices, as measured by TEM/CBED 17
Influence of experimental parameters on the determination of tetragonal distortion in heterostructures by LACBED 17
Strain analysis in submicron electron devices by convergent beam electron diffraction 17
Strain in Silicon below Si3N4 Stripes, Comparison between SUPREM IV Calculation and TEM/CBED Measurements 17
The nature of electrically inactive antimony in silicon 17
Planar defects and misfit dislocations in (001) GaAs/Ge heterostructures MOCVD grown with different V/III ratio 17
Determination of bulk mismatch values in heterostructures by TEM/CBED 17
Numerical analysis of the process-induced stresses in silicon microstructures: application to micromachined cantilever 16
Determination of lattice strain in local isolation structures by electron diffraction techniques and micro-Raman spectroscopy 16
Transmission electron diffraction techniques for nm scale strain measurement in semiconductors 16
Strain mapping in deep sub-micron Si devices by convergent beam electron diffraction in the STEM 15
Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray microdiffraction and modeling 15
Bulk mismatch values of heterostructures as determined from convergent beam electron diffraction on thin cross sections 15
Damage and recovery in doped SOI layers after high energy implantation 15
ON THE EPITAXIAL RELATIONSHIPS OF TISI2 ON SILICON 15
On the assessment of local stress distributions in integrated circuits 15
Strain and Ge concentration determinations in SiGe/Si multiple quantum wells by TEM methods 15
Strain Characterisation at the nm Scale of Deep Sub-Micron Devices by Convergent-Beam Electron Diffraction 15
La microanalisi a Raggi X in microscopia elettronica TEM e SEM 12
Application of convergent beam electron diffraction to two-dimensional strain mapping in silicon devices 12
Totale 1.861
Salva come PNG Salva come JPEG
Categoria #
all - tutte 6.992
article - articoli 5.108
book - libri 71
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 357
Totale 12.528
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2023/202414 0 0 0 0 0 0 0 0 3 0 11 0
2024/2025930 3 5 73 39 197 66 2 36 2 82 243 182
2025/2026917 76 146 127 246 262 38 22 0 0 0 0 0
Totale 1.861