CNR Institutional Research Information System

FIORENZA, PATRICK
 Distribuzione geografica
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Continente #
AS - Asia 3.949
NA - Nord America 1.699
EU - Europa 866
SA - Sud America 624
AF - Africa 87
OC - Oceania 9
Continente sconosciuto - Info sul continente non disponibili 1
Totale 7.235
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Nazione #
US - Stati Uniti d'America 1.614
SG - Singapore 1.583
CN - Cina 1.024
BR - Brasile 492
HK - Hong Kong 397
VN - Vietnam 370
IT - Italia 282
FR - Francia 208
KR - Corea 191
FI - Finlandia 84
IN - India 81
JP - Giappone 78
NL - Olanda 67
DE - Germania 53
AR - Argentina 49
GB - Regno Unito 45
ZA - Sudafrica 31
IL - Israele 30
ID - Indonesia 29
CA - Canada 28
BD - Bangladesh 26
MX - Messico 25
IQ - Iraq 22
EC - Ecuador 21
CO - Colombia 19
PL - Polonia 18
RU - Federazione Russa 15
ES - Italia 14
KE - Kenya 11
TR - Turchia 11
CL - Cile 10
PE - Perù 10
PY - Paraguay 10
SA - Arabia Saudita 10
UA - Ucraina 10
AE - Emirati Arabi Uniti 9
EG - Egitto 9
MA - Marocco 9
PH - Filippine 9
TH - Thailandia 9
UZ - Uzbekistan 9
IE - Irlanda 8
PK - Pakistan 8
AT - Austria 7
SE - Svezia 7
BG - Bulgaria 6
CR - Costa Rica 6
JM - Giamaica 6
JO - Giordania 6
MY - Malesia 6
NP - Nepal 6
TN - Tunisia 6
UY - Uruguay 6
AZ - Azerbaigian 5
DK - Danimarca 5
DZ - Algeria 5
RO - Romania 5
TT - Trinidad e Tobago 5
TW - Taiwan 5
VE - Venezuela 5
AU - Australia 4
CZ - Repubblica Ceca 4
DO - Repubblica Dominicana 4
LB - Libano 4
LV - Lettonia 4
NZ - Nuova Zelanda 4
OM - Oman 4
PA - Panama 4
CI - Costa d'Avorio 3
HN - Honduras 3
KG - Kirghizistan 3
LT - Lituania 3
MD - Moldavia 3
AL - Albania 2
AO - Angola 2
BO - Bolivia 2
GM - Gambi 2
GR - Grecia 2
HR - Croazia 2
IR - Iran 2
KW - Kuwait 2
NO - Norvegia 2
PT - Portogallo 2
QA - Qatar 2
SK - Slovacchia (Repubblica Slovacca) 2
SN - Senegal 2
AF - Afghanistan, Repubblica islamica di 1
BB - Barbados 1
BE - Belgio 1
BF - Burkina Faso 1
BH - Bahrain 1
BW - Botswana 1
BY - Bielorussia 1
CG - Congo 1
GE - Georgia 1
GT - Guatemala 1
HU - Ungheria 1
KH - Cambogia 1
LA - Repubblica Popolare Democratica del Laos 1
LC - Santa Lucia 1
Totale 7.222
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Città #
Singapore 956
Hefei 462
Hong Kong 390
San Jose 348
Santa Clara 347
Seoul 188
Lauterbourg 170
Beijing 167
Ho Chi Minh City 127
Ashburn 122
Los Angeles 120
Hanoi 97
Dallas 69
Cavallino 48
Lappeenranta 44
Tokyo 40
Buffalo 34
New York 33
São Paulo 33
Minamishinagawa 29
Catania 28
Messina 25
Bengaluru 23
Helsinki 22
Orem 20
Haiphong 19
Milan 18
Frankfurt am Main 16
Guangzhou 16
Turku 16
Pretoria 15
Rio de Janeiro 15
Warsaw 15
Casale sul Sile 14
Curitiba 13
Da Nang 13
Montreal 13
Council Bluffs 12
Chennai 11
Miami 11
Seattle 11
Baghdad 10
Bologna 10
Brooklyn 10
Rome 10
Bangkok 9
Belo Horizonte 9
Falkenstein 9
Johannesburg 9
Mumbai 9
Munich 9
Nairobi 9
Palermo 9
Phoenix 9
Quito 9
Amsterdam 8
Brasília 8
Campinas 8
Jakarta 8
Quận Một 8
Tashkent 8
Dublin 7
Guarulhos 7
Hải Dương 7
Lima 7
Padova 7
Recife 7
Thái Bình 7
Amman 6
Atlanta 6
Buenos Aires 6
Istanbul 6
Naples 6
Ninh Bình 6
Phủ Lý 6
Poplar 6
Ribeirão Preto 6
San Francisco 6
Shanghai 6
Stockholm 6
Asunción 5
Baku 5
Biên Hòa 5
Cairo 5
Chicago 5
Denver 5
Dhaka 5
Manaus 5
Manchester 5
New Delhi 5
Osaka 5
Philadelphia 5
Portsmouth 5
San José 5
Santo André 5
Shenzhen 5
São Gonçalo 5
Anápolis 4
Boston 4
Caracas 4
Totale 4.566
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Nome #
Tunneling and thermionic emission as charge transport mechanisms in W-based Schottky contacts on AlGaN/GaN heterostructures 113
Correlating electron trapping and structural defects in Al2O3 thin films deposited by plasma enhanced atomic layer deposition 98
Charge Trapping Mechanisms in Nitridated SiO2/ 4H-SiC MOSFET Interfaces: Threshold Voltage Instability and Interface Chemistry 95
Current transport mechanisms in au-free metallizations for cmos compatible gan hemt technology 93
Temperature-dependent Fowler-Nordheim electron barrier height in SiO2/4H-SiC MOS capacitors 88
Highly Homogeneous 2D/3D Heterojunction Diodes by Pulsed Laser Deposition of MoS2 on Ion Implantation Doped 4H-SiC 78
Anomalous Electrical Behavior of 4H-SiC Schottky Diodes in Presence of Stacking Faults 78
Nano-electrical characterization of praseodymium oxide on silicon by conductive atomic force microscopy (C-AFM) 77
Direct imaging of the core-shell effect in positive temperature coefficient of resistance-BaTiO3 ceramics 74
Challenges for energy efficient wide band gap semiconductors power devices 70
SiO2/4H-SiC interface doping during post-deposition-annealing of the oxide in N2O or POCl3 70
Structural and electrical correlation in aluminum nitride thin films grown by plasma enhanced atomic layer deposition as interface insulating layers on silicon carbide (4H-SiC) 69
Role of density gradients in the growth dynamics of 2-dimensional MoS2 using liquid phase molybdenum precursor in chemical vapor deposition 68
Space charge limited current in 4H-SiC Schottky diodes in the presence of stacking faults 67
Multiscale Investigation of the Structural, Electrical and Photoluminescence Properties of MoS2 Obtained by MoO3 Sulfurization 66
Electrical passivation of stacking-fault crystalline defects in MOS capacitors on cubic silicon carbide (3C-SiC) by post-deposition annealing 64
Schottky contacts on sulfurized silicon carbide (4H-SiC) surface 63
Al2O3 Layers Grown by Atomic Layer Deposition as Gate Insulator in 3C-SiC MOS Devices 62
Advanced characterizations of insulator/semiconductor interfaces in SiC and GaN 61
Complementary Two Dimensional Carrier Profiles of 4H-SiC MOSFETs by Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy 61
Effects of deposition temperature on the microstructural and electrical properties of praseodymium oxide-based films 60
High capacitance density by CaCu3Ti4O12 thin films 60
Thermionic Field Emission in the Lifetime Estimation of p-GaN Gate HEMTs 59
Electrical and Structural Properties of Ohmic Contacts of SiC Diodes Fabricated on Thin Wafers 58
Defect formation and evolution in the step-flow growth of silicon carbide: A Monte Carlo study 57
Plasma enhanced atomic layer deposition of Al2O3 gate dielectric thin films on AlGaN/GaN substrates: The role of surface predeposition treatments 56
CaCu3TiO12 thin films on conductive oxide electrode: a comparative study between chemical and physical vapor deposition routes 56
Understanding the impact of extended crystalline defects on 4H-SiC power MOSFETs by multiscale correlative electrical, optical and thermal characterizations 56
Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy 56
Comparing post-deposition and post-metallization annealing treatments on Al2O3/GaN capacitors for different metal gates 56
Impact of the NO annealing duration on the SiO2/4H–SiC interface properties in lateral MOSFETs: The energetic profile of the near-interface-oxide traps 56
Identification of two trapping mechanisms responsible of the threshold voltage variation in SiO2/4H-SiC MOSFETs 56
Praseodymium based dielectrics: Metal-Organic Chemical Vapor Deposition (MOCVD) growth, characterization and applications 56
Towards vertical Schottky diodes on bulk cubic silicon carbide (3C-SiC) 55
Temperature and time dependent electron trapping in Al2O3 thin films onto AlGaN/GaN heterostructures 54
Probing the uniformity of hydrogen intercalation in quasi-free-standing epitaxial graphene on SiC by micro-Raman mapping and conductive atomic force microscopy 53
Interface state density evaluation of high quality hetero-epitaxial 3C-SiC(0 0 1) for high-power MOSFET applications 53
Study of the impact of growth and post-growth processes on the surface morphology of 4H silicon carbide films 53
Impact of the Schottky Barrier and Contact‐Induced Strain Variations inside the Channel on the Electrical Behavior of Monolayer MoS2 Transistors 53
Study of behavior of p-gate in Power GaN under positive voltage 53
Structural and Insulating Behaviour of High-Permittivity Binary Oxide Thin Films for Silicon Carbide and Gallium Nitride Electronic Devices 53
Early Growth Stages of Aluminum Oxide (Al2O3) Insulating Layers by Thermal- and Plasma-Enhanced Atomic Layer Deposition on AlGaN/GaN Heterostructures 52
Study of Magnesium Activation Effect on Pinch-Off Voltage of Normally-Off p-GaN HEMTs for Power Applications 52
Active dopant profiling and Ohmic contacts behavior in degenerate n-type implanted silicon carbide 52
Aluminum Frenkel defects cause hysteresis in Al2O3/AlGaN capacitors 52
Hydrogen Etching Process of 4H-SiC (0001) in Limited Regions 52
Large-Area MoS2 Films Grown on Sapphire and GaN Substrates by Pulsed Laser Deposition 52
High-Resolution Two-Dimensional Imaging of the 4H-SiC MOSFET Channel by Scanning Capacitance Microscopy 51
Properties of SiO2/4H-SiC interfaces with an oxide deposited by a high-temperature process 51
Probing at nanoscale underneath the gate oxides in 4H-SiC MOS-based devices annealed in N2O and POCI3 51
Gold nanoparticle assisted synthesis of MoS2 monolayers by chemical vapor deposition 51
Thin films advanced dielectrics for high frequency applications: deposition, (nano)characterization and device fabrication 50
Experimental characterization of proteins immobilized on Si-based materials 50
Perovskite CaCu3Ti4O12 thin films for capacitive applications: From the growth to the nanoscopic imaging of the permittivity 50
High Temperature Etching for Threading Dislocation Investigation on GaN Epi-Layer 50
Consideration on the extrapolation of the low insulator field TDDB in 4H-SiC power MOSFETs 50
CaCu3Ti4O12 thin films for capacitive applications: MOCVD synthesis and nanoscopic microscopic characterization 49
Effect of high temperature annealing (T > 1650 degrees C) on the morphological and electrical properties of p-type implanted 4H-SiC layers 49
Ni Schottky barrier on heavily doped phosphorous implanted 4H-SiC 49
4H-SiC MOSFET Threshold Voltage Instability Evaluated via Pulsed High-Temperature Reverse Bias and Negative Gate Bias Stresses 49
Towards aluminum oxide/aluminum nitride insulating stacks on 4H–SiC by atomic layer deposition 49
Reliability of thermally oxidized SiO2/4H-SiC by conductive atomic force microscopy 48
Micro- and nanoscale electrical characterization of large-area graphene transferred to functional substrates 48
Current transport in Ni Schottky barrier on GaN epilayer grown on free standing substrates 48
An insight into the epitaxial nanostructures of NiO and CeO2 thin film dielectrics for AlGaN/GaN heterostructures 47
Limiting mechanism of inversion channel mobility in Al-implanted lateral 4H-SiC metal-oxide semiconductor field-effect transistors 46
Forward and reverse current transport mechanisms in tungsten carbide Schottky contacts on AlGaN/GaN heterostructures 45
Processing Issues for Reliable 4H-SiC MOSFET 44
Reliable evaluation method for interface state density and effective channel mobility in lateral 4H-SiC MOSFETs 44
Conduction Mechanisms at Interface of AIN/SiN Dielectric Stacks with AIGaN/GaN Heterostructures for Normally-off HEMTs: Correlating Device Behavior with Nanoscale Interfaces Properties 44
Ni/Heavily-Doped 4H-SiC Schottky Contacts 44
Nanotechnology for Electronic Materials and Devices 43
CaCu(3)Ti(4)O(12) single crystals: insights on growth and nanoscopic investigation 42
Impact of substrate steps and of monolayer-bilayer junctions on the electronic transport in epitaxial graphene on 4H-SiC (0001) 41
Epitaxial NiO gate dielectric on AlGaN/GaN heterostructures 41
Carrot-like crystalline defects on the 4H-SiC powerMOSFET yield and reliability 41
From micro- to nanotransport properties in Pr2O3-based thin layers 40
Fabrication and characterization of ohmic contacts to 3C-SiC layers grown on silicon 40
Properties of Al2O3 thin films deposited on 4H-SiC by reactive ion sputtering 40
Selective Doping in Silicon Carbide Power Devices 40
Potentialities of nickel oxide as dielectric for GaN and SiC devices 39
Status and prospects of cubic silicon carbide power electronics device technology 39
High permittivity cerium oxide thin films on AlGaN/GaN heterostructures 39
Highly homogeneous current transport in ultra-thin aluminum nitride (AlN) epitaxial films on gallium nitride (GaN) deposited by plasma enhanced atomic layer deposition 39
Nanolaminated Al2O3/HfO2 dielectrics for silicon carbide based devices 38
Evolution of Interface State Density and Near Interface Oxide Traps under Controlled Nitric Oxide Annealing in SiO2/SiC Lateral MOSFETs 38
Nanoscale characterization of electrical transport at metal/3C-SiC interfaces 37
Characterization of SiO2/4H-SiC Interfaces in 4H-SiC MOSFETs: A Review 37
Electrical properties of CeO2 thin films deposited on AlGaN/GaN heterostructure 37
Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer 36
High capacitance density capacitors based on calcium copper titanate thin films grown by MOCVD 36
Carbonization and transition layer effects on 3C-SiC film residual stress 36
Scanning probe microscopy investigation of the mechanisms limiting electronic transport in substrate-supported graphene 36
Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs 34
Micro and nanoscale electrical characterization of large-area graphene transferred to functional substrates 34
Effects of the growth rate on the quality of 4H silicon carbide films for MOSFET applications 34
Impact of Morphological Features on the Dielectric Breakdown at SiO2/3C-SiC Interfaces 33
Voids-free 3C-SiC/Si interface for high quality epitaxial layer 33
Carrier transport in advanced semiconductor materials 33
Colossal permittivity in advanced functional heterogeneous materials: the relevance of the local measurements at submicron scale 33
Totale 5.242
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Categoria #
all - tutte 25.176
article - articoli 20.131
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 540
Totale 45.847
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2023/202436 0 0 0 0 0 0 0 0 0 0 32 4
2024/20252.852 14 16 189 89 321 336 195 151 82 91 719 649
2025/20264.646 298 554 442 686 775 204 774 264 257 262 130 0
Totale 7.534